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pro vyhledávání: '"Ahmed Sobhi Saleh"'
Publikováno v:
Nanomaterials, Vol 14, Iss 22, p 1834 (2024)
As electronic devices continue to shrink in size and increase in complexity, the current densities in interconnects drastically increase, intensifying the effects of electromigration (EM). This renders the understanding of EM crucial, due to its sign
Externí odkaz:
https://doaj.org/article/f0644cf989a54ae1877aa39e72899f0c
