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pro vyhledávání: '"Ahmad M. D. (Assa'd) Jaber"'
Autor:
Ahmad M. D. (Assa’d) Jaber, Ammar Alsoud, Saleh R. Al-Bashaish, Hmoud Al Dmour, Marwan S. Mousa, Tomáš Trčka, Vladimír Holcman, Dinara Sobola
Publikováno v:
Technologies, Vol 12, Iss 6, p 87 (2024)
In this study, the thickness of a thin film (tc) at a low primary electron energy of less than or equal to 10 keV was calculated using electron energy-loss spectroscopy. This method uses the ratio of the intensity of the transmitted background spectr
Externí odkaz:
https://doaj.org/article/16c3a5c768764e488def49184613c62f
