Zobrazeno 1 - 10
of 11
pro vyhledávání: '"Adriana Giordana"'
Autor:
F. S. Miller, W. G. Ramsey, K. Guilbeau, F. Salzano, R. Barletta, A. A. Ramsey, M. Steinberg, J.R. Powell, Adriana Giordana, J. Jordan, T. F. Meaker, T. Sanders, J. D. Smith, M. Reich, B. M. Kauffman, M. McCarthy, E.W. Bohannan, G. Maise, L. Ventre, B. Manowitz
Publikováno v:
Environmental Issues and Waste Management Technologies in the Ceramic and Nuclear Industries IX
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::80d4e36c456566ff8aa7fd50e15aa06c
https://doi.org/10.1002/9781118407004.ch33
https://doi.org/10.1002/9781118407004.ch33
Publikováno v:
Journal of Electronic Materials. 20:949-958
Photoreflectance (PR) was used to study SIMOX materials produced under various fabrication conditions. The position, amplitude and shape of the 3.4 eV PR response were monitored for three different sets of samples which provided information about the
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::ece6cd4df4da962e7d8e9b95c9256f67
https://doi.org/10.1007/bf02816038
https://doi.org/10.1007/bf02816038
Autor:
Adriana Giordana, Robert Glosser
Publikováno v:
Review of Scientific Instruments. 62:1027-1030
An alternative form of application of an electric field to semiconductors so as to provide electroreflectance modulation is presented. Two metallic contacts, a large ring‐shaped one enclosing a small transparent one, are deposited on the specimen s
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::0a5a8c4ab37860567794eb52bdd2cbab
https://doi.org/10.1063/1.1142053
https://doi.org/10.1063/1.1142053
Autor:
Adriana Giordana, Robert Glosser
Publikováno v:
Journal of Applied Physics. 69:3303-3308
We present the results from the photoreflectance (PR) analysis of a set of molecular‐beam epitaxially grown silicon on sapphire films whose thicknesses ranged from 6 to 4000 nm. The strain undergone by the silicon films due to lattice mismatch at t
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::bf9937a77e9254ba9265f1293acadce9
https://doi.org/10.1063/1.348552
https://doi.org/10.1063/1.348552
Autor:
Robert Glosser, Adriana Giordana
Publikováno v:
Review of Scientific Instruments. 61:2327-2330
This article evaluates a photoreflectance apparatus in which unwanted photoluminescence and laser light are separated from the signal by a monochromator placed in front of the detector as compared to separation by the more commonly used glass filters
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::ca3ed51b8027dd8ddb0dbf07b2d5ac0f
https://doi.org/10.1063/1.1141359
https://doi.org/10.1063/1.1141359
Autor:
M. McCarthy, Joe D. Seger, W. G. Ramsey, K. Guilbeau, P. Jacobs, Adriana Giordana, Evan Peacock
Publikováno v:
MRS Proceedings. 852
Digital Scanning Calorimetry (DSC), a thermal characterization technique, can be used to rapidly obtain a rough upper estimate of the firing temperature of archaeological pottery as well as an indication of its composition. The technique involves hea
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::207aaef2f554159fb0082c20f46ea89f
https://doi.org/10.1557/proc-852-oo8.6
https://doi.org/10.1557/proc-852-oo8.6
Autor:
Joseph P. Estrera, Edward J. Bender, S. Rehg, Mike J. Iosue, P. P. Lin, T. Chau, J. W. Glesener, Timothy W. Sinor, Adriana Giordana
Publikováno v:
SPIE Proceedings.
This paper details an image intensifier enhancement program at Litton Electro-Optical Systems (LEOS) and the U.S. Army Night Vision and Electronic Sensors Directorate (NVESD) for the development of an unfilmed bulk conductive glass (BCG) Microchanel
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::339896860e92f3737a1836fae6e38a8d
https://doi.org/10.1117/12.405876
https://doi.org/10.1117/12.405876
Autor:
Edward J. Bender, Michael J. Iosue, J. W. Glesener, Timothy W. Sinor, Adriana Giordana, Joseph P. Estrera, Po-Ping Lin
Publikováno v:
SPIE Proceedings.
Current Generation II Gallium Arsenide (GaAs) image intensifier tube technology requires that the tube microchannel plate (MCP) component have a thin dielectric coating on the side facing the tube's photocathode component. This protective coating sub
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::7048cb6c41fe5614f04776bb89488800
https://doi.org/10.1117/12.405881
https://doi.org/10.1117/12.405881
Autor:
Joseph G. Pellegrino, Eliezer Dovid Richmond, Syed B. Qadri, Adriana Giordana, Keith A. Joyner, Gordon P. Pollack, Mark E. Twigg, Robert Glosser
Publikováno v:
MRS Proceedings. 188
Photoreflectance (PR) was used to study crystalline quality and stress in silicon films on insulator. The position and amplitude of the 3.4 eV PR silicon structure was monitored for both MBE silicon on sapphire (SOS) and SIMOX structures. The SOS fil
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::1001591e961ed2c2a133332cc9c426ef
https://doi.org/10.1557/proc-188-349
https://doi.org/10.1557/proc-188-349
Publikováno v:
Materials Letters. 8:64-68
Photoreflectance was used for the first time to study silicon films on sapphire (SOS). The film thicknesses ranged from 150 to 40 000 A. The 3.4 eV structure was monitored with bulk silicon as a standard. A shift of this structure toward lower energi
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::902670dc6e33423027bb381c6dd5a458
https://doi.org/10.1016/0167-577x(89)90099-2
https://doi.org/10.1016/0167-577x(89)90099-2