Zobrazeno 1 - 10
of 15
pro vyhledávání: '"Adrian Sulich"'
Autor:
Aneta Masłowska, Dominika M. Kochanowska, Adrian Sulich, Jaroslaw Z. Domagala, Marcin Dopierała, Michał Kochański, Michał Szot, Witold Chromiński, Andrzej Mycielski
Publikováno v:
Sensors, Vol 24, Iss 2, p 345 (2024)
This study explores the suitability of (Cd,Mn)Te and (Cd,Mn)(Te,Se) as room-temperature X-ray and gamma-ray detector materials, grown using the Bridgman method. The investigation compares their crystal structure, mechanical and optical properties, an
Externí odkaz:
https://doaj.org/article/7809cc5384dc44bda04e1bd62221f5ea
Autor:
Sushma Mishra, Wojciech Paszkowicz, Adrian Sulich, Rafal Jakiela, Monika Ożga, Elżbieta Guziewicz
Publikováno v:
Materials, Vol 16, Iss 1, p 151 (2022)
In this work, the properties of ZnO films of 100 nm thickness, grown using atomic layer deposition (ALD) on a–(100) and c–(001) oriented Al2O3 substrate are reported. The films were grown in the same growth conditions and parameters at six differ
Externí odkaz:
https://doaj.org/article/85858cd090914e0281b683cb0c803beb
Autor:
Sushma Mishra, Ewa Przezdziecka, Wojciech Wozniak, Abinash Adhikari, Rafal Jakiela, Wojciech Paszkowicz, Adrian Sulich, Monika Ozga, Krzysztof Kopalko, Elzbieta Guziewicz
Publikováno v:
Materials, Vol 14, Iss 14, p 4048 (2021)
The structural, optical, and electrical properties of ZnO are intimately intertwined. In the present work, the structural and transport properties of 100 nm thick polycrystalline ZnO films obtained by atomic layer deposition (ALD) at a growth tempera
Externí odkaz:
https://doaj.org/article/a396ea33949f4bb1a6525ddc59b741d3
Autor:
Sushma Mishra, Bartlomiej S. Witkowski, Rafal Jakiela, Zeinab Khosravizadeh, Wojciech Paszkowicz, Adrian Sulich, Oksana Volnianska, Wojciech Wozniak, Elzbieta Guziewicz
Publikováno v:
physica status solidi (a). 220
Autor:
Aneta Wardak, Dominika M. Kochanowska, Michał Kochański, Marcin Dopierała, Adrian Sulich, Janusz Gdański, Adam Marciniak, Andrzej Mycielski
Publikováno v:
Journal of Alloys and Compounds. 936:168280
Autor:
Adrian Sulich, Elżbieta Łusakowska, Wojciech Wołkanowicz, Piotr Dziawa, Janusz Sadowski, Badri Taliashvili, Tomasz Wojtowicz, Tomasz Story, Jaroslaw Z. Domagala
Challenges and opportunities arising from molecular beam epitaxial growth of topological crystalline insulator heterostructures composed of a rock-salt SnTe(001) layer of varying thickness (from 80 nm to 1000 nm) and a zinc blende 4 mu m thick CdTe(0
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::184272d8095821af2e7d374c199e5362
http://urn.kb.se/resolve?urn=urn:nbn:se:lnu:diva-110635
http://urn.kb.se/resolve?urn=urn:nbn:se:lnu:diva-110635
Autor:
Rafal Jakiela, E. Przezdziecka, Krzysztof Kopalko, Monika Ozga, Adrian Sulich, Wojciech Paszkowicz, Elzbieta Guziewicz, Abinash Adhikari, Sushma Mishra, Wojciech Wozniak
Publikováno v:
Materials
Volume 14
Issue 14
Materials, Vol 14, Iss 4048, p 4048 (2021)
Volume 14
Issue 14
Materials, Vol 14, Iss 4048, p 4048 (2021)
The structural, optical, and electrical properties of ZnO are intimately intertwined. In the present work, the structural and transport properties of 100 nm thick polycrystalline ZnO films obtained by atomic layer deposition (ALD) at a growth tempera
Autor:
Adrian Sulich
Publikováno v:
Humanistyka i Przyrodoznawstwo. :519-562
Artykuł jest semiotycznym studium map sieci odwrotnej ‒ wykresów stosowanych we współczesnych naukach przyrodniczych do reprezentacji dyfrakcji promieniowania rentgenowskiego na kryształach. Źródłem badanego materiału są artykuły z dzied
Autor:
Dina V. Deyneko, Sergey Yu. Stefanovich, Bogdan I. Lazoryak, Adrian Sulich, Sergey M. Aksenov, M. B. Kosmyna, Alexey N. Shekhovtsov, Wojciech Paszkowicz, Vadim V. Grebenev, K. N. Belikov
Publikováno v:
CrystEngComm. 20:6310-6318
Grown by the Czochralski method, pure magnesium and lithium doped Ca9Y(VO4)7 single crystals (Ca9Y(VO4)7 (C1), Ca9Y(VO4)7:Li (C2) and Ca9Y(VO4)7:Mg (C3), respectively) are characterized by means of chemical analysis, X-ray diffraction analysis and hi
Autor:
D. Jarosz, Adrian Sulich, Rafal Jakiela, D. Snigurenko, W. Paszkowicz, P. Sybilski, E. Przezdziecka, E. Guziewicz
Publikováno v:
Journal of Applied Physics. 127:075104
Understanding the origin of the strong difference of electrical parameters between as grown and annealed undoped ZnO films prepared at a temperature range of 100–200 °C by thermal atomic layer deposition is essential for their future applications.