Zobrazeno 1 - 10
of 47
pro vyhledávání: '"Adrian Niculae"'
Publikováno v:
Microscopy Today. 28:46-53
In the 50 years since the first mating of semiconductor-based energy-dispersive X-ray spectrometry (EDS) with the scanning electron microscope (SEM), this hybrid instrument has become an indispensable microanalytical tool. In the last two decades a n
Autor:
Robert Hartmann, Lothar Strüder, Stefan Aschauer, Heike Soltau, Adrian Niculae, Jeffrey Davis
Publikováno v:
Microscopy and Microanalysis. 25:272-273
Autor:
K. Hermenau, K. Heinzinger, Heike Soltau, Adrian Niculae, A. Liebel, Lothar Strüder, A. Bechteler, Thiago Barros
Publikováno v:
Microscopy and Microanalysis. 25:1768-1769
Autor:
Klaus Heizinger, Adrian Niculae, K. Hermenau, A. Bechteler, Lothar Strüder, Robert Lackner, Heike Soltau, Tristan Mönninghoff, Thiago Barros
Publikováno v:
Microscopy and Microanalysis. 25:516-517
Autor:
Jeffrey M. Davis, A. Bechteler, Heike Soltau, A. Liebel, Robert Lackner, Adrian Niculae, A. Schoning
Publikováno v:
Microscopy and Microanalysis. 24:1144-1145
Autor:
Robert Lackner, A. Liebel, Maximilian Schmid, Heike Soltau, Daniel Steigenhöfer, Grigore Moldovan, Adrian Niculae
Publikováno v:
Microscopy and Microanalysis. 24:650-651
Autor:
Heike Soltau, Jeffrey Davis, Lothar Strüder, Peter Holl, Robert Hartmann, Martin Huth, Dieter Schlosser, Adrian Niculae
Publikováno v:
Microscopy and Microanalysis. 24:990-991
Autor:
K. Hermenau, A. Liebel, A. Bechteler, Adrian Niculae, Heike Soltau, A. Schoning, Lothar Strüder, K. Heinzinger
Publikováno v:
Microscopy and Microanalysis. 24:796-797
Autor:
Adrian Niculae, Maximilian Schmid, Robert Lackner, Daniel Steigenhöfer, Heike Soltau, A. Liebel
Publikováno v:
Microscopy and Microanalysis. 23:10-11
Publikováno v:
Microscopy and Microanalysis. 23:76-77