Zobrazeno 1 - 10
of 22
pro vyhledávání: '"Adrian, Zakrzewski"'
Publikováno v:
Sensors, Vol 23, Iss 16, p 7120 (2023)
The stability and repeatability of laser metal deposition is particularly important when processing multiple layers or depositing material on complex component surfaces, and requires the use of process parameter control including the stand-off distan
Externí odkaz:
https://doaj.org/article/42e41fe5205a4f15b9951d4a99fc6452
Publikováno v:
Sensors, Vol 21, Iss 1, p 8 (2020)
Imaging scatterometry is a method for determining the reflection distribution based on bidirectional reflectance distribution function (BRDF) measurements. However, it has a well-known limitation that results obtained by imaging scatterometry for sma
Externí odkaz:
https://doaj.org/article/2ee8ee6bb7014fdeb43bbac91bc797cd
Autor:
Irena, Jacukowicz-Sobala, Agnieszka, Ciechanowska, Elżbieta, Kociołek-Balawejder, Anna, Gibas, Adrian, Zakrzewski
Publikováno v:
Journal of hazardous materials. 431
The purpose of the presented study was to explore the photocatalytic activity of Cu
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=pmid________::17bfbaf48a3b978946ce0fca09f91451
https://pubmed.ncbi.nlm.nih.gov/35220119
https://pubmed.ncbi.nlm.nih.gov/35220119
Publikováno v:
Applied optics. 60(11)
In this paper, the results of experimental characterization of an optical system consisting of a chromatic confocal displacement sensor integrated with an optical laser head are presented. As a result of integration, the part of the optical path of t
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::763bea5535957188f4b3397e656bc675
https://pubmed.ncbi.nlm.nih.gov/33983224
https://pubmed.ncbi.nlm.nih.gov/33983224
Autor:
Irena Jacukowicz-Sobala, Agnieszka Ciechanowska, Elżbieta Kociołek-Balawejder, Anna Gibas, Adrian Zakrzewski
Publikováno v:
Journal of Hazardous Materials. 431:128529
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::3e5bf11838c8352cefd189e58bb096e7
https://doi.org/10.1016/j.jhazmat.2022.128529
https://doi.org/10.1016/j.jhazmat.2022.128529
Publikováno v:
Sensors
Volume 21
Issue 1
Sensors, Vol 21, Iss 8, p 8 (2021)
Sensors (Basel, Switzerland)
Volume 21
Issue 1
Sensors, Vol 21, Iss 8, p 8 (2021)
Sensors (Basel, Switzerland)
Imaging scatterometry is a method for determining the reflection distribution based on bidirectional reflectance distribution function (BRDF) measurements. However, it has a well-known limitation that results obtained by imaging scatterometry for sma
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::13fcb59cc43d44951a86a7289e8bd9c9
Publikováno v:
Applied optics. 59(29)
In this paper, the methodology for design of the system consisting of chromatic confocal displacement sensor integrated with an optical laser head was presented. Furthermore, the results of experimental characterization of optical components of the l
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::caba22a67e2965e705a749ac2a3d34a3
https://pubmed.ncbi.nlm.nih.gov/33104621
https://pubmed.ncbi.nlm.nih.gov/33104621
Publikováno v:
Journal of Materials Science: Materials in Electronics. 28:13937-13949
This paper presents an analysis of thermal oxidation kinetics for Aluminium nitride (AlN) epitaxy layers using three methods: dry, wet and mixed. The structures thus obtained were examined by means of scanning electron microscope, energy-dispersive X
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::eb11b28adf6e84c3e0715c8fc55dedf0
https://doi.org/10.1007/s10854-017-7243-5
https://doi.org/10.1007/s10854-017-7243-5
Publikováno v:
Optics and Measurement International Conference 2019.
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::74ef9d04ad636af9cc1d1fa5e1863fe9
https://doi.org/10.1117/12.2542409
https://doi.org/10.1117/12.2542409
Publikováno v:
Materials Science-Poland, Vol 34, Iss 4, Pp 868-871 (2016)
In this study, the authors deposited silicon oxynitride films by Radio Frequency Plasma Enhanced Chemical Vapour Deposition (RF PECVD) method. The research explores the relationship between the deposition process parameters and the optical properties
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::b329e391aa579263a1a6746559cf0c5f
https://doaj.org/article/140f5ace72f74f5bbcb1627a2b4a5ca0
https://doaj.org/article/140f5ace72f74f5bbcb1627a2b4a5ca0