Zobrazeno 1 - 10
of 45
pro vyhledávání: '"Adkisson, J."'
Autor:
Adkisson, J. A., Fraser, Don R.
Publikováno v:
Financial Analysts Journal. Sep/Oct2003, Vol. 59 Issue 5, p24-27. 4p.
Autor:
Adkisson, J. A., Fraser, D. R.
Publikováno v:
Journal of International Banking Regulation. Jun2003, Vol. 4 Issue 4, p328. 10p. 2 Charts, 2 Graphs.
Autor:
Adkisson, J. Amanda, Fraser, Donald R.
Publikováno v:
Journal of Financial Services Research. Jul90, Vol. 4 Issue 2, p145-155. 11p. 2 Charts.
Autor:
Pekarik, John J., Adkisson, J., Gray, P., Liu, Q., Camillo-Castillo, R., Khater, M., Jain, V., Zetterlund, B., DiVergilio, A., Tian, X., Vallett, A., Ellis-Monaghan, J., Gross, B. J., Cheng, P., Kaushal, V., He, Z., Lukaitis, J., Newton, K., Kerbaugh, M., Cahoon, N.
Publikováno v:
2014 IEEE Bipolar/BiCMOS Circuits & Technology Meeting (BCTM); 2014, p92-95, 4p
Autor:
Jain, Vibhor, Gross, B. J., Pekarik, J. J., Adkisson, J. W., Camillo-Castillo, R. A., Liu, Qizhi, Gray, P. B., Vallett, A., Divergilio, A. W., Zetterlund, B. K., Harame, D. L.
Publikováno v:
2014 IEEE Bipolar/BiCMOS Circuits & Technology Meeting (BCTM); 2014, p5-8, 4p
Autor:
Camillo-Castillo, R.A., Liu, Q.Z., Adkisson, J. W., Khater, M.H., Gray, P. B., Jain, V., Leidy, R.K., Pekarik, J. J., Gambino, J.P., Zetterlund, B., Willets, C., Parrish, C., Engelmann, S.U., Pyzyna, A.M., Cheng, P., Harame, D. L.
Publikováno v:
2013 IEEE Bipolar/BiCMOS Circuits & Technology Meeting (BCTM); 01/01/2013, p227-230, 4p
Autor:
Jain, Vibhor, Cheng, Peng, Gross, B. J., Camillo-Castillo, R., Pekarik, J. J., Adkisson, J. W., Liu, Qizhi, Gray, P. B., Kaushal, V., Harame, D., Divergilio, Adam W.
Publikováno v:
2013 IEEE Bipolar/BiCMOS Circuits & Technology Meeting (BCTM); 01/01/2013, p73-76, 4p
Autor:
Peng Cheng, Dahlstrom, M., Qizhi Liu, Gray, P., Adkisson, J., Zetterlund, B., Pekarik, J., Camillo-Castillo, R., Radic, L., Ellis-Monaghan, J., Harame, D.
Publikováno v:
2011 IEEE Bipolar/BiCMOS Circuits & Technology Meeting (BCTM); 2011, p154-157, 4p
Autor:
Gambino, J., Leidy, B., Adkisson, J., Jaffe, M., Rassel, R.J., Wynne, J., Ellis-Monaghan, J., Hoague, T., Meatyard, D., Mongeon, S., Kryzak, T.
Publikováno v:
2006 International Electron Devices Meeting; 2006, p1-4, 4p
Publikováno v:
1997 IEEE International Integrated Reliability Workshop Final Report (Cat No97TH8319); 1997, p97-102, 6p