Zobrazeno 1 - 4
of 4
pro vyhledávání: '"Aditya Nechiyil"'
Publikováno v:
Instruments, Vol 8, Iss 3, p 37 (2024)
The counterfeiting of integrated circuits (ICs) has been a growing issue. Current available methods used to detect counterfeit ICs can be expensive, imprecise, and time-consuming. This paper explores the resonant cavity system: a non-contact, non-des
Externí odkaz:
https://doaj.org/article/1cd14d49293d4aab9d839e6accd58c7a
Publikováno v:
2021 IEEE Physical Assurance and Inspection of Electronics (PAINE).
Publikováno v:
Journal of Failure Analysis & Prevention; Oct2024, Vol. 24 Issue 5, p2105-2112, 8p
Publikováno v:
Instruments (2410-390X); Sep2024, Vol. 8 Issue 3, p37, 12p