Zobrazeno 1 - 2
of 2
pro vyhledávání: '"Adbelbaset M. Elwazri"'
Publikováno v:
JOM. 58:20-26
Low-voltage field-emission scanning-electron microscopy offers the possibility to characterize a wide range of materials. Electron optics in an electron beam column have improved in recent decades and now probe diameters of 1–10 nm can be obtained,
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::b4497950c63b2121b4e707463885206c
https://doi.org/10.1007/s11837-006-0155-0
https://doi.org/10.1007/s11837-006-0155-0
Publikováno v:
JOM: The Journal of The Minerals, Metals & Materials Society (TMS); Mar2006, Vol. 58 Issue 3, p20-26, 7p, 1 Diagram, 7 Graphs