Zobrazeno 1 - 4
of 4
pro vyhledávání: '"Adam T. Caridi"'
Publikováno v:
ECS Meeting Abstracts. :2351-2351
Wide band gap (WBG) materials (i.e., Silicon Carbide (SiC)) have attracted much attention in the semiconductor arena because of their intrinsic properties (i.e. high capacitance, thermal stability, and wear resistance). In order to achieve the desire
Publikováno v:
ECS Meeting Abstracts. :2353-2353
As integrated circuits (ICs) and logic devices continue to shrink according to Moore’s Law, the demand for enhanced Chemical Mechanical Planarization (CMP) processes has increased dramatically. More specifically, an area that has gained tremendous
Publikováno v:
ECS Meeting Abstracts. :2281-2281
Wide band gap (WBG) materials (i.e. Silicon Carbide (SiC)) are rapidly emerging in the semiconductor arena because of their properties (i.e. high capacitance, thermal stability, and wear resistance), which allow these substrates to be used as insulat
Autor:
Jason J. Keleher, Kiana A. Cahue, Katherine M. Wortman-Otto, Abigail N. Linhart, Adam T Caridi, Abigail L. Dudek
Publikováno v:
ECS Meeting Abstracts. :655-655