Zobrazeno 1 - 6
of 6
pro vyhledávání: '"Adam Birge"'
Autor:
Emily Lunde, Shannon E. Washburn, Timothy A. Cudd, Kelsey Nation, Adam Birge, Charles R. Goodlett
Publikováno v:
Behavior Research Methods. 49:1838-1851
Pavlovian eye blink conditioning (EBC) has been extensively studied in humans and laboratory animals, providing one of the best-understood models of learning in neuroscience. EBC has been especially useful in translational studies of cerebellar and h
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::fefd60ed7a52e963ba27959fd89dc313
https://doi.org/10.3758/s13428-016-0826-x
https://doi.org/10.3758/s13428-016-0826-x
Autor:
Yue Kuo, Adam Birge
Publikováno v:
Journal of The Electrochemical Society. 159:H595-H598
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::d46bdfe0d91f6d2b10757cdc405e0c76
https://doi.org/10.1149/2.109206jes
https://doi.org/10.1149/2.109206jes
Publikováno v:
ECS Transactions. 3:193-201
A new nonvolatile floating gate memory based on hole trapping and detrapping is demonstrated. Metal-oxide-semiconductor capacitors were fabricated with an embedded nanolayer of crystalline indium-tin-oxide layer (ITO) in the zirconium-doped hafnium o
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::51b7a6ce53ba87a03f0d6837c5c5cb77
https://doi.org/10.1149/1.2355711
https://doi.org/10.1149/1.2355711
Publikováno v:
Journal of The Electrochemical Society. 154:H887
A floating gate metal-oxide-semiconductor capacitor memory device utilizing nanocrystalline indium tin oxide (ITO) layer embedded in a zirconium-doped hafnium oxide (Zr-doped HfO 2 ) high-k gate dielectric has been fabricated and studied. The embedde
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::5e011a1819dcf3fc9c56e648a39b633a
https://doi.org/10.1149/1.2768291
https://doi.org/10.1149/1.2768291
Publikováno v:
ECS Meeting Abstracts. :1108-1108
not Available.
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::115a1809244997db6b7b0b6c78ff8bf2
https://doi.org/10.1149/ma2006-02/22/1108
https://doi.org/10.1149/ma2006-02/22/1108
Publikováno v:
Journal of The Electrochemical Society; Oct2007, Vol. 154 Issue 10, pH887-H893, 7p, 8 Graphs