Zobrazeno 1 - 10
of 17
pro vyhledávání: '"Adam Łaszcz"'
Publikováno v:
Sensors, Vol 22, Iss 23, p 9324 (2022)
This paper presents the results of beam investigations on semiconductor IR lasers using novel detectors based on thermocouples. The work covers the design, the fabrication of detectors, and the experimental validation of their sensitivity to IR radia
Externí odkaz:
https://doaj.org/article/62b0d9eae26144c8b18a2f763b3eba95
Publikováno v:
Sensors, Vol 22, Iss 1, p 287 (2021)
The focused ion beam (FIB) technique was used to fabricate a nanothermocouple (with a 90 nm wide nanojunction) based on a metal–semiconductor (Pt–Si) structure, which showed a sensitivity up to 10 times larger (with Seebeck coefficient up to 140
Externí odkaz:
https://doaj.org/article/f08fb51ab0fb41b8b707e6b07db71cb5
Autor:
Anton Koroliov, Genyu Chen, Kenneth M. Goodfellow, A. Nick Vamivakas, Zygmunt Staniszewski, Peter Sobolewski, Mirosława El Fray, Adam Łaszcz, Andrzej Czerwinski, Christiaan P. Richter, Roman Sobolewski
Publikováno v:
Applied Sciences, Vol 9, Iss 3, p 391 (2019)
The terahertz time-domain spectroscopy (THz-TDS) technique has been used to obtain transmission THz-radiation spectra of polymer nanocomposites containing a controlled amount of exfoliated graphene. Graphene nanocomposites (1 wt%) that were used in t
Externí odkaz:
https://doaj.org/article/b7c03b64102a45fab8d7ff991f152ffa
Publikováno v:
Sensors, Vol 22, Iss 287, p 287 (2022)
Sensors (Basel, Switzerland)
Sensors (Basel, Switzerland)
The focused ion beam (FIB) technique was used to fabricate a nanothermocouple (with a 90 nm wide nanojunction) based on a metal–semiconductor (Pt–Si) structure, which showed a sensitivity up to 10 times larger (with Seebeck coefficient up to 140
Autor:
Alexey Kolmakov, Emanuele Pelucchi, Michael Fay, LUCIA NASI, Maria Varela, Rafael García Roja, Dmitry Lobanov, Helge Weman, Ferdinand Hofer, Rafal Dunin-Borkowski, Markus Weyers, Joel Eymery, Gazi Aliev, Marina Gutiérrez Peinado, Hitoshi Tampo, Eric Tournié, Douglas Paul, Slawomir Kret, Federico Corni, Graziella Malandrino, Paul Midgley, PEDRO L. GALINDO, Cécile Hébert, Alexander Vasiliev, Adalberto Balzarotti, Ana Sanchez, Grzegorz Jurczak, Ondrej Klimo, Wsevolod Lundin, Matthew Weyland, Thomas Walther, Sandra Van Aert, Dmitri Nikolichev, Lothar Houben, Sascha Sadewasser, Viacheslav Golovanov, Adam Łaszcz, Ian Watson, Srinivasan Anand, Vittorio Morandi, Alessandra Catellani, Paul Munroe, Lydia Laffont, Ursel Bangert, Nicolas Grandjean, Jennifer Gray, Annika Lohstroh, Paul Sellin, Andreu Cabot, Jie Zhang, Ernesto Placidi, Evgenii Zavarin, Jacek Ratajczak, Richard Beanland, Mohammed Benaissa, Dmitri GOLBERG, Michael Stöger-Pollach, Paul Harrison, Monica Bollani, Alexey Novikov, Gilles Patriarche, Vadim Sirotkin, Meilin Liu, Miriam Herrera Collado, Sergey Rubanov, Adam Wojcik, ANNA SGARLATA, Arnold Den Dekker, Thomas Dekorsy, André Vantomme, George Cirlin, Jerzy KĄTCKI, Daniel Hill, Masanori Mitome, Xavier Aymerich, Sergio I. Molina, Paweł Dłużewski, Roberta grazia Toro, Souren Grigorian, Klaus Leifer, Mark Aindow, Jean-Michel Chauveau, Giuseppe Nicotra, Martin Albrecht, Corrado Bongiorno, Jiří Limpouch, Hele Savin
Publikováno v:
A. G. Cullis, P. A. Midgley. CRC Press, 4 p., 2018, 9781351074636. ⟨10.1201/9781351074636⟩
International audience; In Accumulated Low Schottky Barrier metal oxide semiconductor field effect transistors (MOSFET) on SOl structures, very thin silicide layers are used for ohmic contacts. Silicide contacts form due to metallurgical reaction of
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::301d0be2daf17c1032417a5026374bfe
https://hal.science/hal-03555261
https://hal.science/hal-03555261
Autor:
Piotr Karbownik, Maciej Bugajski, Jacek Ratajczak, Andrzej Czerwiński, Piotr Gutowski, Adam Łaszcz, Kamil Pierściński, Mariusz Płuska, Dorota Pierścińska
Publikováno v:
Microelectronics Reliability. 55:2142-2146
Focused ion beam (FIB) systems have become very useful tools used in the nanotechnology because they provide easy prototyping or post-processing customization of individual devices. A practical application of such post-processing is modification of m
Autor:
Adam Łaszcz, Mariusz Płuska, Tadeusz Piotrowski, Jacek Ratajczak, Krzysztof Hejduk, Andrzej Czerwiński, M. Lipiński
Publikováno v:
Solid State Phenomena. 186:66-69
We present results of the study on the silicon nanoparticles formation in multilayer silicon nitride structures. These structures consist of pairs of stoichiometric silicon nitride dielectric layers (SiNx) and silicon rich nitride layers (SRN). Silic
Publikováno v:
Vacuum. 82:977-981
In this paper, the optimization of ohmic contacts for semiconductor lasers based on InGaAs/GaAs/GaAlAs layers is reported. Transmission electron microscopy (TEM) and electrical methods were used to study extensively the Pt/Ti/Pt/Au metallization syst
Autor:
A. Klimov, W. Slysz, Andrzej Czerwiński, Renata Kruszka, R. Puźniak, Roman Sobolewski, M. Juchniewicz, M. Wegrzecki, Marek Guziewicz, Adam Łaszcz, Michał A. Borysiewicz, Raivo Stern, E. Joon, Wolfgang Lang, Bernd Aichner
Publikováno v:
SPIE Proceedings.
Performance of superconducting single-photon detectors based on resistive hotspot formation in nanostripes upon optical photon absorption depends strongly on the critical current density J C of the fabricated nanostructure. Utilization of an ultrathi
Autor:
Anna Szerling, Maciej Sakowicz, Kamil Kosiel, Krystyna Gołaszewska, Rafal Jakiela, Mariusz Płuska, A. Piotrowska, Artur Trajnerowicz, Z. R. Wasilewski, Michał Szymański, Michał Walczakowski, Adam Łaszcz, Norbert Palka
Publikováno v:
SPIE Proceedings.
We report our research on processing of AlGaAs/GaAs structures for THz quantum-cascade lasers (QCLs). We focus on the processes of fabrication of Ti/Au claddings for metal-metal waveguides and the wafer bonding with indium solder. We place special em