Current Compliance Circuit to Improve Variation in ON State Characteristics and to Minimize RESET Current

Autor: Adaku Ochia, Pragya R. Shrestha, Gary Harris, Kin P. Cheung, Jason P. Campbell, Canute Vaz, Ji-Hong Kim, Helmut Baumgart

Publikováno v: ECS Transactions. 50:11-17

The wide distribution of ON and OFF values and high SET current in resistive memory is attributed to the high current overshoot during the SET process. In this paper we show a circuit which is capable of precisely limiting the current during SET proc

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_________::e6acdbdc730024d679f2b65540d03e84
https://doi.org/10.1149/05034.0011ecst

Poster: Memristive Systems

Autor: Jung Ho Yoon, Hyung-Suk Jung, Min Hwan Lee, Gun Hwan Kim, Seul Ji Song, Jun Yeong Seok, Kyung Jean Yoon, Cheol Seong Hwang, M.-P. Besland, J. Tranchant, E. Souchier, P. Moreau, S. Salmon, B. Corraze, E. Janod, L. Cario, Raúl Zazpe, Mariana Ungureanu, Roger Llopis, Federico Golmar, Pablo Stoliar, Félix Casanova, Luis Eduardo Hueso, C. Hermes, M. Wimmer, S. Menzel, K. Fleck, V. Rana, M. Salinga, U. Böttger, R. Bruchhaus, M. Wuttig, R. Waser, F. Lentz, B. Rösgen, T. Selle, Astrid Marchewka, Stephan Menzel, Ulrich Böttger, Rainer Waser, Brian Hoskins, Fabien Alibart, Dmitri Strukov, Luca Pellegrino, Nicola Manca, Teruo Kanki, Hidekazu Tanaka, Michele Biasotti, Emilio Bellingeri, Antonio Sergio Siri, Daniele Marré, Antonio Claudio M. Padilha, Gustavo Martini Dalpian, Alexandre Reily Rocha, Themistoklis Prodromakis, Iulia Salaoru, Ali Khiat, Christopher Toumazou, Ella M. Gale, A. Madhavan, G. Adam, F. Alibart, L. Gao, D. B. Strukov, D. Wamwangi, W. Welnic, Behrad Gholipour, Chung-Che Huang, Alexandros Anastasopoulos, Feras Al-Saab, Brian E. Hayden, Daniel W. Hewak, Rui Lan, Rie Endo, Masashi Kuwahara, Yoshinao Kobayashi, Masahiro Susa, Paul Baumeister, Daniel Wortmann, Stefan Blügel, Riccardo Mazzarello, Yan Li, Wei Zhang, Ider Ronneberger, Ronnie Simon, Jens Gallus, Dimitrios Bessas, Ilya Sergueev, Hans-Christian Wille, Raphaël Pierre Hermann, Jennifer Luckas, Pascal Rausch, Daniel Krebs, Peter Zalden, Janika Boltz, Jean-Yves Raty, Martin Salinga, Christophe Longeaud, Matthias Wuttig, Haeri Kim, Dong-Wook Kim, Soo-Hyon Phark, Seungbum Hong, C. Park, A. Herpers, J. Verbeeck, R. Egoavil, F. Borgatti, G. Panaccione, F. Offi, R. Dittmann, Sergiu Clima, Kiroubanand Sankaran, Maarten Mees, Yang Yin Chen, Ludovic Goux, Bogdan Govoreanu, Dirk J. Wouters, Jorge Kittl, Malgorzata Jurczak, Geoffrey Pourtois, P. Calka, E. Martinez, V. Delaye, D. Lafond, G. Audoit, D. Mariolle, N. Chevalier, H. Grampeix, C. Cagli, V. Jousseaume, C. Guedj, Pragya Shrestha, Adaku Ochia, Kin. P. Cheung, Jason Campbell, Helmut Baumgart, Gary Harris, Malte Scherff, Bjoern Meyer, Julius Scholz, Joerg Hoffmann, Christian Jooss, Bo Xiao, Tomofumi Tada, Tingkun Gu, Arihiro Tawara, Satoshi Watanabe, Tai-Fa Young, Ya-Liang Yang, Ting-Chang Chang, Kuang-Ting Hsu, Chao-Yu Chen, A Burkert, I. Valov, G. Staikov, Jan van den Hurk, Ilia Valov, Stefan Tappertzhofen, Jan van der Hurk, B. Hoskins, Jeong Ho Yoon, Kyung Jin Yoon, Yao Shuai, Chuangui Wu, Wanli Zhang, Shengqiang Zhou, Danilo Bürger, Stefan Slesazeck, Thomas Mikolajick, Manfred Helm, Heidemarie Schmidt, Ella Gale, David Pearson, Stephen Kitson, Andrew Adamatzky, Ben de Lacy Costello, Eero Lehtonen, Jussi Poikonen, Mika Laiho, Pentti Kanerva, Hyungkwang Lim, Ho-won Jang, Doo Seok Jeong, Xun Cao, Meng Jiang, Feng Zhang, Xinjun Liu, Ping Jin, Kai Zhang, Madhavi Tangirala, Salinporn Kittiwatanakul, Jiwei Lu, Stuart Wolf, Venkateswara Pallem, Christian Dussarrat, S. Pinto, R. Krishna, C. Dias, G. Pimentel, G. N. P. Oliveira, J. M. Teixeira, P. Aguiar, E. Titus, J. Gracio, J. Ventura, J. P. Araujo

Publikováno v: Frontiers in Electronic Materials

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_________::ecdb4c5efeade90e4022d2ef7f6c66f7
https://doi.org/10.1002/9783527667703.ch67

High-Speed Endurance and Switching Measurements for Memristive Switches

Autor: Kin P. Cheung, Adaku Ochia, Jason P. Campbell, Gary Harris, Pragya R. Shrestha, Helmut Baumgart

Publikováno v: Electrochemical and Solid-State Letters. 15:H173

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_________::cee3da945cf6119102ae1406a23a1a50
https://doi.org/10.1149/2.002206esl