Zobrazeno 1 - 2
of 2
pro vyhledávání: '"Adahil Muniz"'
Publikováno v:
IEEE Design & Test. 39:15-22
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::656819d5797762b40b7d7b0dff51fb31
https://doi.org/10.1109/mdat.2022.3142193
https://doi.org/10.1109/mdat.2022.3142193
Publikováno v:
SBCCI
Column-Line-Code (CLC) is an Error Correction Code (ECC) designed to correct multiple errors in memory devices for critical applications. CLC has originally two decoder modes: CLC Standard (CLC-S) and CLC Extended (CLC-E). CLC-E presents higher effic
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::ab67741a348d9b9554bcf64f99416610
https://doi.org/10.1109/sbcci50935.2020.9189901
https://doi.org/10.1109/sbcci50935.2020.9189901