Performance characterization of microtomography with complementary metal-oxide-semiconductor detectors for computer-aided defect inspection.

Autor: Kim, Ho Kyung, Yun, Seungman, Han, Jong Chul, Youn, Hanbean, Cho, Min Kook, Lim, Chang Hwy, Heo, Sung Kyn, Shon, Cheol-Soon, Kim, Seong-Sik, Cho, Bong Hae, Achterkirchen, Thorsten Graeve

Publikováno v: Journal of Applied Physics; May2009, Vol. 105 Issue 9, p094701-094708, 8p, 4 Color Photographs, 5 Black and White Photographs, 1 Diagram, 3 Graphs

Very Large Area CMOS Active-Pixel Sensor for Digital Radiography.

Autor: Farrier, Michael^1,2, Achterkirchen, Thorsten Graeve^2,3, Weckler, Gene P.^2,4, Mrozack, Alex⁵

Publikováno v: IEEE Transactions on Electron Devices. Nov2009, Vol. 56 Issue 11, p2623-2631. 9p. 3 Black and White Photographs, 4 Diagrams, 1 Chart, 6 Graphs.