Zobrazeno 1 - 10
of 12
pro vyhledávání: '"Abishai, Daniel"'
Autor:
Jon Shaffer, Sankha Banerjee, Abishai Daniel, Saquib Ahmed, Jalen Harris, Shaestagir Chowdhury, Michael Pham, Aboubakr Ali
Publikováno v:
Superlattices and Microstructures. 130:20-27
We have simulated the operation and functionality of a working Sn-based perovskite solar cell device using GPVDM and compared it against a Pb-based device. The results are extremely promising in that they showcase comparable cell efficiencies, with t
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::9ceaceccbbb491feb0e487a797d31a0e
https://doi.org/10.1016/j.spmi.2019.04.017
https://doi.org/10.1016/j.spmi.2019.04.017
Autor:
Saquib Ahmed, Aboubakr Ali, Jalen Harris, Shaestagir Chowdhury, Michael Pham, Sankha Banerjee, Abishai Daniel, Jon Shaffer
Publikováno v:
Journal of Materials Science: Materials in Electronics. 30:9438-9443
We have simulated the operation and functionality of a working Bi-based perovskite solar cell device using GPVDM and compared it against a Pb-based device. The results are extremely promising in that they showcase comparable cell efficiencies, with t
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::312196a9f2a2674b4f716053ef323ea4
https://doi.org/10.1007/s10854-019-01275-3
https://doi.org/10.1007/s10854-019-01275-3
Autor:
Bhat, Aayush, Elsen, Renold S., Abishai, Daniel, Jayaprakash Narayan, M., Sakthivel, Aravind Raj, Chadha, Utkarsh, Hirpha, Bulcha Bukele
Publikováno v:
Advances in Materials Science & Engineering; 7/30/2022, p1-11, 11p
Autor:
Xiaogang Sun, Litrin Jiang, Nishi Ahuja, Abishai Daniel, Yanbing Sun, Tianyu Zhou, Lifei Zhang, Xiang Zhou, Rahul Khanna, Chuan Song
Publikováno v:
2017 33rd Thermal Measurement, Modeling & Management Symposium (SEMI-THERM).
This paper introduced one optimized proactive cooling management approach based on power variation trend analysis. Through analyzing the data center historical power telemetries, the power predictor is able to predicate power variation with 5– 15 m
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::6ad03b444bb34d68cb3c5ce9e6188947
https://doi.org/10.1109/semi-therm.2017.7896923
https://doi.org/10.1109/semi-therm.2017.7896923
Publikováno v:
2016 32nd Thermal Measurement, Modeling & Management Symposium (SEMI-THERM).
When aging fans in server chassis wear out, they slow down and circulate less air, eventually causing overheating condition and unexpected thermal shutdown. We propose a novel approach to predictive analysis of fan failures before the significant wea
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::d868a4f84e08f06686677ecfc18d1015
https://doi.org/10.1109/semi-therm.2016.7458451
https://doi.org/10.1109/semi-therm.2016.7458451
Autor:
Abishai Daniel, Nishi Ahuja
Publikováno v:
2015 31st Thermal Measurement, Modeling & Management Symposium (SEMI-THERM).
Prior studies have demonstrated component silicon reliability sensitivity to datacenter cooling strategies that include containment and non-containment cooling with return side setpointing. In this work, the evaluations were compared to supply side s
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::a2748e3e3f7802ccbabd22455c2d7f42
https://doi.org/10.1109/semi-therm.2015.7100181
https://doi.org/10.1109/semi-therm.2015.7100181
Publikováno v:
2015 31st Thermal Measurement, Modeling & Management Symposium (SEMI-THERM).
Rapid growth of internet services and mobile devices has led to more and larger cloud data centers. The hyper scale cloud data center consumes enormous amount of electricity and cause pressure to operation cost and infrastructure management. The indu
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::ee8ec1f75f08f5241e48b5e7623f9912
https://doi.org/10.1109/semi-therm.2015.7100134
https://doi.org/10.1109/semi-therm.2015.7100134
Autor:
Abishai Daniel, James Mendes
Publikováno v:
2015 Annual Reliability and Maintainability Symposium (RAMS).
For reliability, it is crucial to understand the impact of aging on a component to insure that performance specifications are met throughout the design lifetime. This paper describes a Monte Carlo based predictive modeling framework to comprehend agi
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::d7758c78a01e68e601ba0230ae8b57c7
https://doi.org/10.1109/rams.2015.7105119
https://doi.org/10.1109/rams.2015.7105119
Autor:
Abishai Daniel, Nishi Ahuja
Publikováno v:
2014 Semiconductor Thermal Measurement and Management Symposium (SEMI-THERM).
In a data center environment, the temperature that a chip experiences is an important parameter determining its reliability. A high operating temperature can cause it to wearout prematurely. A low temperature results in additional cooling costs to op
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::9f14344242e8642d4c538001e3069d54
https://doi.org/10.1109/semi-therm.2014.6892239
https://doi.org/10.1109/semi-therm.2014.6892239