Zobrazeno 1 - 10
of 55
pro vyhledávání: '"Abhilash Goyal"'
Publikováno v:
IEEE Transactions on Components, Packaging and Manufacturing Technology. 3:236-246
In this paper, a one-port test approach is proposed for testing radio frequency (RF) interconnects as well as RF passive filters embedded in RF substrates. The proposed technique relies on the use of an RF oscillator that is coupled to the embedded i
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::3f60dddd8d8f4de7433928ac26a1a997
https://doi.org/10.1109/tcpmt.2012.2226582
https://doi.org/10.1109/tcpmt.2012.2226582
Publikováno v:
IEEE Transactions on Very Large Scale Integration (VLSI) Systems. 20:1835-1848
This paper proposes a new self-healing methodology for embedded RF amplifiers in RF sub-systems. The proposed methodology is based on oscillation principles in which the device-under-test (DUT) generates its test signature with the help of additional
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::1a564b9a00c9408913c0761a3b22e787
https://doi.org/10.1109/tvlsi.2011.2163953
https://doi.org/10.1109/tvlsi.2011.2163953
Publikováno v:
IEEE Transactions on Advanced Packaging. 33:669-680
A low-cost test method is proposed for testing integrated radio-frequency (RF) substrates with embedded RF passive filters. The proposed method enables the testing of embedded high-frequency gigahertz filters by the analysis of low-frequency signal o
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::07009be7fce82fd8518c9f5df34d297d
https://doi.org/10.1109/tadvp.2010.2052923
https://doi.org/10.1109/tadvp.2010.2052923
Publikováno v:
Journal of Electronic Testing. 26:13-24
In this paper, we propose a low-cost approach for testing GHz RF amplifiers. It is demonstrated for the first time that GHz RF amplifiers can be tested for their specifications using oscillation principles. In the test mode, the RF test signal is "se
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::50e9adef97b708d532cba5fcfd4c3cb4
https://doi.org/10.1007/s10836-009-5126-2
https://doi.org/10.1007/s10836-009-5126-2
Publikováno v:
ISQED
In this paper, a new self-healing methodology is proposed for designing 3D-ICs with self-correctable circuits for thermal effects. Therefore, this methodology enables 3D-ICs to work properly without designing/introducing sophisticated heat removing c
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::f059393ab6dbaa63aac6ba504e7c599b
https://doi.org/10.1109/isqed.2014.6783322
https://doi.org/10.1109/isqed.2014.6783322
Publikováno v:
2014 IEEE International Conference on Electronics, Computing and Communication Technologies (CONECCT).
In this paper we present optimal transmit precoding schemes for distributed estimation in a correlated wireless sensor network. The presented schemes employ linear preprocessing with multiple transmit antennas and are based on a coherent MAC between
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::94ef58c8c9a5a3d0a4fcf5c1460b655c
https://doi.org/10.1109/conecct.2014.6740191
https://doi.org/10.1109/conecct.2014.6740191
Autor:
Yuya Suzuki, Nitesh Kumbhat, Venky Sundaram, Ryota Mori, Srikrishna Sitaraman, Toshihiko Jimbo, Rao Tummala, Fuhan Liu, Abhilash Goyal, Masakazu Hashimoto
Publikováno v:
2012 IEEE 62nd Electronic Components and Technology Conference.
Miniaturization of wireless sub-systems through high-density integration of actives and passives is in hour of need with the increasing demand for portable devices. Considering that a thin, planar form-factor is much sought-after for mobile devices,
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::1a42c6e78da01d30445b73c5d8855edc
https://doi.org/10.1109/ectc.2012.6249021
https://doi.org/10.1109/ectc.2012.6249021
Publikováno v:
ISQED
In this paper, a self-testable SiGe low noise amplifier (LNA) is designed and a Built-in-Self-Test (BIST) methodology is proposed for amplifiers embedded in RF systems. In this BIST methodology, the RF amplifier has the capability to simultaneously t
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::8e76947799b38c62c18b8f81f8aa2381
https://doi.org/10.1109/isqed.2012.6187467
https://doi.org/10.1109/isqed.2012.6187467
Publikováno v:
2011 IEEE 54th International Midwest Symposium on Circuits and Systems (MWSCAS).
This paper presents a self-correcting and self-testing approaches for post manufacturing yield improvement of RF circuits embedded in the RF systems. In the proposed approaches, the test signature is self-generated from the Device-Under-Test (DUT) wi
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::f8cbf3e909fb505fc2bd9b3c17f5efbe
https://doi.org/10.1109/mwscas.2011.6026669
https://doi.org/10.1109/mwscas.2011.6026669