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pro vyhledávání: '"Abel Fontserè"'
Autor:
Juan Campos, Pablo Pedreira, Igors Sics, Alejandro Crisol, Dominique Heinis, Josep Nicolas, Abel Fontserè
Publikováno v:
The Review of scientific instruments. 90(2)
We propose a new concept of a deflectometer, aimed to provide high accuracy measurements with high sampling rate and low noise, as required by state-of-the-art slope-measuring profilometers, like Long Trace Profilometers or Nanometer Optics Measuring
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::adc229f8146c20533da7d03c518978f9
https://pubmed.ncbi.nlm.nih.gov/30831724
https://pubmed.ncbi.nlm.nih.gov/30831724
