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pro vyhledávání: '"Abdul Haleem Malik"'
Autor:
Abdul Haleem Malik, Mohammed Amer Karout, Haiyong Wan, Jose Ortiz Gonzalez, Philip Mawby, M. Taha
Publikováno v:
Power Electronic Devices and Components, Vol 9, Iss , Pp 100070- (2024)
Efficient management of high-magnitude current spikes during Dynamic Reverse Bias (DRB) reliability testing is critical for early detection of potential issues such as gate oxide degradation in wide bandgap (WBG) devices. This paper addresses the cha
Externí odkaz:
https://doaj.org/article/9bddaa8fa35e4f66af852a8189920fc1
Publikováno v:
SSRN Electronic Journal.
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::fcdf4c23a14d5281f14386e7bbb4556c
https://doi.org/10.2139/ssrn.4172631
https://doi.org/10.2139/ssrn.4172631