Zobrazeno 1 - 5
of 5
pro vyhledávání: '"Abdelhamid Amar"'
Publikováno v:
Applied Sciences, Vol 11, Iss 22, p 10720 (2021)
The main objective of our paper is to propose an approach to studying the mechatronic system’s reliability through the reliability of their high electron mobility transistors (HEMT). The operating temperature is one of the parameters that influence
Externí odkaz:
https://doaj.org/article/d08bccc224a84e4bb864331bb0c9b92c
Publikováno v:
International Journal for Simulation and Multidisciplinary Design Optimization
International Journal for Simulation and Multidisciplinary Design Optimization, 2022, 13, pp.2. ⟨10.1051/smdo/2021035⟩
International Journal for Simulation and Multidisciplinary Design Optimization, Vol 13, p 2 (2022)
International Journal for Simulation and Multidisciplinary Design Optimization, EDP sciences/NPU (China), 2022, 13, pp.2. ⟨10.1051/smdo/2021035⟩
International Journal for Simulation and Multidisciplinary Design Optimization, 2022, 13, pp.2. ⟨10.1051/smdo/2021035⟩
International Journal for Simulation and Multidisciplinary Design Optimization, Vol 13, p 2 (2022)
International Journal for Simulation and Multidisciplinary Design Optimization, EDP sciences/NPU (China), 2022, 13, pp.2. ⟨10.1051/smdo/2021035⟩
International audience; The electro-thermomechanical modeling study of the High Electron Mobility Transistor (HEMT) has been presented, all the necessary equations are detailed and coupled. This proposed modeling by the finite element method using th
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::34f811a184a951d1baa93fbf1515e296
https://hal.science/hal-03515784/file/smdo210004.pdf
https://hal.science/hal-03515784/file/smdo210004.pdf
Publikováno v:
Incertitudes et fiabilité des systèmes multiphysiques. 5
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::8d519731070365f710b7f2918a69cd5c
https://doi.org/10.21494/iste.op.2022.0782
https://doi.org/10.21494/iste.op.2022.0782
Publikováno v:
Microelectronics Reliability. 124:114299
Among the most important components in complex and high-power mechatronic systems is the transistor. The High Electron Mobility Transistor (HEMT) is a technology under development. This paper presents the hybrid Reliability Based Design Optimization
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::072925f2ce8d44252c474fd6d60ae471
https://doi.org/10.1016/j.microrel.2021.114299
https://doi.org/10.1016/j.microrel.2021.114299
Publikováno v:
Incertitudes et fiabilité des systèmes multiphysiques. 3
La mecatronique est une discipline qui combine entre la mecanique, l'electronique et l'informatique. L'apparition des systemes mecatronique donne naissance a des phenomenes de defaillance et de degradation qui se developpe avec le temps et qui ne son
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::9f8fe73e944ebf3c6142752556dd8389
https://doi.org/10.21494/iste.op.2019.0431
https://doi.org/10.21494/iste.op.2019.0431