Bipolar AC Switch for Specific Mains Applications: Design, Realization, and Characterization

Autor: Abdelhakim Bourennane, Marie Breil, Hiba Rizk, Jean-Pierre Laur

Publikováno v: IEEE Transactions on Electron Devices. 66:3704-3709

This paper deals with the design of an ac switch structure for specific ac mains applications 230 V–50 Hz. The targeted power level is about a hundred watts, and the currently used converter circuits make use of bidirectional switches that are real

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_________::2b23e1822965825fcc7713c1db2af4a2
https://doi.org/10.1109/ted.2019.2925463

Ensure an original and safe 'fail-to-open' mode in planar and trench power SiC MOSFET devices in extreme short-circuit operation

Autor: François Boige, Stéphane Lefebvre, Abdelhakim Bourennane, Jean-Marc Blaquiere, Frédéric Richardeau, Gerard Guibaud

Publikováno v: 29th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis
29th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis ( ESREF 2018 )
29th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis ( ESREF 2018 ), Oct 2018, Aalborg, Denmark. pp.598-603, ⟨10.1016/j.microrel.2018.07.026⟩
Microelectronics Reliability
Microelectronics Reliability, Elsevier, 2018, 88-90, pp.598-603. ⟨10.1016/j.microrel.2018.07.026⟩

International audience; The purpose of this paper is to present a complete experimentation of the two failure modes in competition that can appear during short-circuit (SC) fault operation of single-chip 1,2kV SiC MOSFETs from different manufacturers

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::016d1d4385282b2398d8103e93d9ae3f
https://hal.science/hal-02180574/document

Study of mechanical stress impact on the I–V characteristics of a power VDMOS device using 2D FEM simulations

Autor: Marie Breil, Jean-Marie Dorkel, Patrick Tounsi, Abdelhakim Bourennane, E. Marcault

Publikováno v: Microelectronics Reliability. 52:489-496

Reliability is a major economic and technical challenge for power electronics dedicated to embedded applications (avionics, automotive, hybrid vehicles, etc.). As the damage in a power assembly is essentially due to thermo-mechanical stress resulting

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_________::e2942d1f212ddf59ae98973489e97ff8
https://doi.org/10.1016/j.microrel.2011.12.028

RC-IGBT-thyristor structure having trenches filled with dielectric on the backside: Physical analysis and application to the integration of a multiphase generic power converter using the 'two-chip' approach

Autor: Abdelhakim Bourennane, Adem Lale, Frédéric Richardeau

Publikováno v: Power Electronics and Applications (EPE'15 ECCE-Europe), 2015 17th European Conference on
Power Electronics and Applications (EPE'15 ECCE-Europe), 2015 17th European Conference on, Sep 2015, Geneva, Switzerland. ⟨10.1109/EPE.2015.7311704⟩

International audience; The RC-IGBT-thyristor is a bidirectional current device proposed as an elementary structure for the integration of a multiphase converter using the "two-chip” integration approach [1]. In this paper, 2D simulations are on on

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::39d888562d9bb9262ecffe2b320788af
https://hal.archives-ouvertes.fr/hal-01235956

A new triggering mode in a vertical bi-directional MOS-thyristor device

Autor: Patrick Austin, J. Jalade, J. L. Sanchez, Abdelhakim Bourennane, Marie Breil

Publikováno v: Microelectronics Journal. 35:277-285

A new mode of triggering in a bi-directional MOS-thyristor device is described and its operating modes are verified using 2D numerical simulations. This device is a vertical MOS controlled bi-directional structure that can be used as an AC switch for

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_________::74660f81eca85c304ee4eb5dcb635afa
https://doi.org/10.1016/s0026-2692(03)00189-7