Zobrazeno 1 - 10
of 15
pro vyhledávání: '"Abdel-Rahman Ibdah"'
Autor:
Puja Pradhan, Puruswottam Aryal, Dinesh Attygalle, Abdel-Rahman Ibdah, Prakash Koirala, Jian Li, Khagendra P. Bhandari, Geethika K. Liyanage, Randy J. Ellingson, Michael J. Heben, Sylvain Marsillac, Robert W. Collins, Nikolas J. Podraza
Publikováno v:
Materials, Vol 11, Iss 1, p 145 (2018)
Real time spectroscopic ellipsometry (RTSE) has been applied for in-situ monitoring of the first stage of copper indium-gallium diselenide (CIGS) thin film deposition by the three-stage co-evaporation process used for fabrication of high efficiency t
Externí odkaz:
https://doaj.org/article/db309d8b3f814c638c2360c60de83e97
Autor:
Puruswottam Aryal, Nikolas J. Podraza, Prakash Koirala, Puja Pradhan, Robert W. Collins, Abdel-Rahman Ibdah, Sylvain Marsillac, Angus Rockett
Publikováno v:
Applied Surface Science. 421:601-607
Complete polycrystalline thin-film photovoltaic (PV) devices employing CuIn1−xGaxSe2/CdS and CdS/CdTe heterojunctions have been studied by ex situ spectroscopic ellipsometry (SE). In this study, layer thicknesses have been extracted along with phot
Autor:
Puruswottam Aryal, Abdel-Rahman Ibdah, Prakash Koirala, Puja Pradhan, Robert W. Collins, Nikolas J. Podraza, Dinesh Attygalle, Sylvain Marsillac, Jian Li
Publikováno v:
Progress in Photovoltaics: Research and Applications. 24:1200-1213
Autor:
Randy J. Ellingson, Prakash Koirala, Robert W. Collins, Michael J. Heben, Khagendra P. Bhandari, Sylvain Marsillac, Nikolas J. Podraza, Geethika K. Liyanage, Abdel-Rahman Ibdah, Puruswottam Aryal, Dinesh Attygalle, Puja Pradhan, Jian Li
Publikováno v:
Materials; Volume 11; Issue 1; Pages: 145
Materials, Vol 11, Iss 1, p 145 (2018)
Materials
Materials, Vol 11, Iss 1, p 145 (2018)
Materials
Real time spectroscopic ellipsometry (RTSE) has been applied for in-situ monitoring of the first stage of copper indium-gallium diselenide (CIGS) thin film deposition by the three-stage co-evaporation process used for fabrication of high efficiency t
Autor:
Puruswottam Aryal, Puja Pradhan, Nikolas J. Podraza, Abdel-Rahman Ibdah, Robert W. Collins, Sylvain Marsillac
Publikováno v:
Spectroscopic Ellipsometry for Photovoltaics ISBN: 9783319753751
Real time spectroscopic ellipsometry (RTSE) has been applied to characterize the structural evolution and final structural properties of ~50–60 nm thin film Cuy(In1−xGax)Se2 (CIGS) solar cell absorber layers deposited by single stage co-evaporati
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::7ea88d680ec31c139b5bc9a835df3bfd
https://doi.org/10.1007/978-3-319-75377-5_11
https://doi.org/10.1007/978-3-319-75377-5_11
Autor:
Sylvain Marsillac, Puja Pradhan, Dinesh Attygalle, Puruswottam Aryal, Robert W. Collins, Nikolas J. Podraza, Abdel-Rahman Ibdah
Publikováno v:
Spectroscopic Ellipsometry for Photovoltaics ISBN: 9783319951379
Spectroscopic ellipsometry (SE) using a rotating compensator multichannel instrument has been applied in real time for characterization of the three stages of the coevaporation process for copper indium-gallium diselenide (CuIn1−xGaxSe2; CIGS) thin
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::ed3e518e345fe87d64a93962e6b60533
https://doi.org/10.1007/978-3-319-95138-6_6
https://doi.org/10.1007/978-3-319-95138-6_6
Autor:
Vikash Ranjan, Puja Pradhan, Sylvain Marsillac, Abdel-Rahman Ibdah, Puruswottam Aryal, Dinesh Attygalle, Krishna Aryal, Nikolas J. Podraza, Robert W. Collins
Publikováno v:
IEEE Journal of Photovoltaics. 4:333-339
In the scale-up of Cu(In1-xGax)Se2 (CIGS) solar cell processing for large-area photovoltaics technology, the challenge is to achieve optimum values of layer thicknesses, as well as CIGS Cu stoichiometry and alloy composition x within narrow ranges an
Autor:
Robert W. Collins, Abdel-Rahman Ibdah, Puja Pradhan, Nikolas J. Podraza, Puruswottam Aryal, Sylvain Marsillac
Publikováno v:
2016 IEEE 43rd Photovoltaic Specialists Conference (PVSC).
CuIn 1−x Ga x Se 2 (CIGS) solar cells fabricated with thin absorber layers were studied by spectroscopic ellipsometry to deduce their multilayer structures, which enable quantum efficiency (QE) simulations. For all cells with thin absorbers studied
Autor:
Sylvain Marsillac, Robert W. Collins, Puruswottam Aryal, Puja Pradhan, Nikolas J. Podraza, Abdel-Rahman Ibdah, Jian Li
Publikováno v:
2016 IEEE 43rd Photovoltaic Specialists Conference (PVSC).
The dielectric functions of CuIn 1−x Ga x Se 2 (CIGS) alloys as deduced by spectroscopic ellipsometry (SE) have been parameterized versus CIGS bandgap E g and versus x. As a result, E g can serve as a free parameter in regression analyses of SE dat
Autor:
Puja Pradhan, Prakash Koirala, Sylvain Marsillac, Robert W. Collins, Nikolas J. Podraza, Abdel-Rahman Ibdah, Puruswottam Aryal, Angus Rockett, Jian Li
Publikováno v:
2015 IEEE 42nd Photovoltaic Specialist Conference (PVSC).
We have studied the effect of substrate temperature in molybdenum (Mo) back contact deposition on its structural evolution, optical properties, and most importantly, the over-deposited CuIn1−xGaxSe2 solar cell performance. A series of Mo thin films