Zobrazeno 1 - 6
of 6
pro vyhledávání: '"Abdallah El-Falou"'
Publikováno v:
Frontiers in Medical Technology, Vol 5 (2023)
Anastomotic leaks (AL) and staple line leaks are a serious post-operative complication that can develop following bariatric surgery. The delay in the onset of symptoms following a leak usually results in reactive diagnostics and treatment, leading to
Externí odkaz:
https://doaj.org/article/51d11845887548a080fe6d52930fea05
Publikováno v:
IEEE Transactions on Electron Devices. 68:1746-1752
We report on the design and characterization of a monolithic single-photon-counting (SPC) X-ray detector integrating an amorphous semiconductor sensor. Our prototype combines amorphous selenium (a-Se), a well-known photoconductor, with a CMOS readout
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::d367eda093f7dacf4e9a6986458fd75f
https://doi.org/10.1109/ted.2021.3063073
https://doi.org/10.1109/ted.2021.3063073
Autor:
Peter M. Levine, Abdallah El-Falou, Rhiannon L. Lohr, Karim S. Karim, Christopher C. Scott, Mohamed Hamid, Yun Zhe Li
Publikováno v:
IEEE Sensors Journal. 21:339-346
We present a monolithic hybrid visible-light imager composed of an amorphous selenium (a-Se) photoconductor thin film integrated on a CMOS active pixel sensor (APS) array readout integrated circuit. We achieve more than 14-dB signal-to-noise ratio un
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::f886979cd8713822a8c654242a7cda95
https://doi.org/10.1109/jsen.2020.3014073
https://doi.org/10.1109/jsen.2020.3014073
Publikováno v:
2018 IEEE International Electron Devices Meeting (IEDM).
We report, for the first time, results from a single-photon-counting X-ray detector monolithically integrated with an amorphous semiconductor. Our prototype detector combines amorphous selenium (a-Se), a well-known X-ray photoconductive material suit
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::7f10e1b9fa2a31d29d0920fcad941bc0
https://doi.org/10.1109/iedm.2018.8614645
https://doi.org/10.1109/iedm.2018.8614645
Publikováno v:
IEEE Electron Device Letters. 36:481-483
We report a monolithic direct-conversion X-ray imager capable of detecting diagnostic level X-rays. The imager is constructed by combining a custom $32 \times 32$ CMOS four-transistor active pixel sensor (4T APS) array with an amorphous selenium phot
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::a60593b35e59e038881d9d904fe75091
https://doi.org/10.1109/led.2015.2410304
https://doi.org/10.1109/led.2015.2410304
Publikováno v:
2015 IEEE International Electron Devices Meeting (IEDM).
We demonstrate measured X-ray dose efficiency results from a 5.6-μm × 6.25-μm pixel-pitch direct-conversion amorphous selenium/CMOS hybrid X-ray imager. Compared to existing scintillator-based imagers, our approach enables up to 100x gains in DQE
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::5aaa58c99c27fec35830e41b2b1832c9
https://doi.org/10.1109/iedm.2015.7409803
https://doi.org/10.1109/iedm.2015.7409803