Výsledky vyhledávání

A Comparative Study of Un-Doped ZnO and in Doping ZnO Thin Films with Various Concentrations, Subjected to Appropriate UHV Treatment and Characterized by Sensitive Spectroscopy Techniques XPS, AES, Reels and PL

Autor: Kadda Benmohktar Bensassi, Edhawya Hameurlaine, M’hamed Guezzoul, M’hammed Bouslama, Abdellah Ouerdane, Abdelkader Belaidi, Amira Derri, Mahmoud Bedrouni, Abdelhak Baizid, Mahfoud Abdelkrim, Bachir Kharoubi

Publikováno v: Annals of West University of Timisoara - Physics. 64:1-21

In this study, we use complementary and sensitive experimental techniques XPS (X-rays Photoelectron Spectroscopy), AES (Auger Electron Spectroscopy, REELS (Reflection Electron Energy-Loss Spectroscopy) and PL (photoluminescence) to investigate and co

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_________::dd54222bc5127ceca8ea2e80cafbd5d0
https://doi.org/10.2478/awutp-2022-0001

Zobrazit plný text záznamu

IMPACT OF INDIUM DOPING ON ZnO THIN FILM SUBJECTED TO APPROPRIATE UHV TREATMENT CHARACTERIZED BY XPS, XRD, AND PL TECHNIQUES

Autor: EDHAWYA HAMEURLAINE, M’HAMED GUEZZOUL, M’HAMMED BOUSLAMA, ABDELLAH OUERDANE, AMIRA DERRI, MAHMOUD BEDROUNI, KADDA BENMOHKTAR BENSASSI, ABDELHAK BAIZID, MAHFOUD ABDELKRIM, BACHIR KHAROUBI

Publikováno v: Surface Review and Letters. 29

The chemical composition, crystalline structure and optical properties of un-doped ZnO (UZO) and indium (6%)-doped ZnO (IZO) thin films grown on Si substrate were studied using X-ray photoelectron spectroscopy (XPS), X-ray diffraction (XRD) and photo

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_________::3f935214b0a5860b86e038aa7798d9d6
https://doi.org/10.1142/s0218625x22500706

Zobrazit plný text záznamu

Point defects behavior analysis in thin films and massif SnO2 by AES spectroscopy and photoluminescence

Autor: Zakia Lounis, Amira Derri, M’hamed Bouslama, Abdelkrim Mahfoud, Amel Hadj-Kaddour, Chawki Zegadi, Djamel Ghaffor

Publikováno v: Journal of Materials Science: Materials in Electronics. 31:10213-10224

Point defect properties of three samples of tin-oxide are analyzed in a comparative two stages study (before and after treatments), using Auger spectroscopy (AES) and Photoluminescence (PL). Samples 1 and 2 are thin films and sample 3 is a massif one

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_________::c56af5a1e8d22af5630ddf576baf4f8b
https://doi.org/10.1007/s10854-020-03567-5

Zobrazit plný text záznamu

Vyhledávací nástroje:

Upřesnit hledání