Zobrazeno 1 - 5
of 5
pro vyhledávání: '"ALLABAKSH SHAIK"'
Autor:
Allabaksh, Shaik1 bakshu9@gmail.com, Senthilraj, R.1,2
Publikováno v:
Rasayan Journal of Chemistry. Apr-Jun2024, Vol. 17 Issue 2, p588-597. 10p.
Autor:
Chippe Keerthi, K.Lokesh Krishna, Allabaksh Shaik, B. Sireesha, Bodipati Tharun Naidu, Dhandu Venkat Karthik Reddy
Publikováno v:
2023 International Conference on Sustainable Computing and Data Communication Systems (ICSCDS).
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::c928fe43d86926ccad811c0a474dde96
https://doi.org/10.1109/icscds56580.2023.10104949
https://doi.org/10.1109/icscds56580.2023.10104949
Autor:
K.Lokesh Krishna, ALLABAKSH SHAIK
Publikováno v:
International Journal of Innovative Technology and Exploring Engineering. 8:3741-3745
Practically all electronic systems are realized using integrated circuit(IC) chips. The IC design requires digital signals, but however the physical signals available routinely are either continuous time varying signals or corrupted discrete voltages
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::5b8f8305ae35e972aa12944d8094b9d5
https://doi.org/10.35940/ijitee.l2665.1081219
https://doi.org/10.35940/ijitee.l2665.1081219
Autor:
K.Lokesh Krishna, ALLABAKSH SHAIK
Publikováno v:
International Journal of Recent Technology and Engineering (IJRTE). 8:5966-5970
In this proposed work, a low offset voltage (mV) and high speed voltage comparator circuit is designed and simulated. With the unceasing rise of various wireless portable communication systems, high speed transceiver circuits, and high speed memory c
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::7187ed5e7a48171585eaeb1a62b44687
https://doi.org/10.35940/ijrte.c6263.098319
https://doi.org/10.35940/ijrte.c6263.098319
Autor:
T. Lavanya, Allabaksh Shaik
Publikováno v:
NCTET-2K17.
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::f7eac2c58d13304e29db49160c02f510
https://doi.org/10.22161/ijaers/nctet.2017.ece.51
https://doi.org/10.22161/ijaers/nctet.2017.ece.51