Zobrazeno 1 - 10
of 20
pro vyhledávání: '"A.N. Sosphenov"'
Autor:
Emilio Burattini, N. N. Salaschenko, S. I. Zheludeva, A.N. Sosphenov, K. A. Prokhorov, E. A. Shamov, Mikhail V. Kovalchuk, G. Cappuccio, N. N. Novikova
Publikováno v:
Journal of Applied Crystallography. 30:833-838
The analysis of the wavefield intensity distribution connected with X-ray standing wave (XRSW) generation above the mirror surface at total reflection (TR) is presented for a vacuum/film/substrate sample along with experimental examples for organic a
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::fb9a7711ba76aa40d5a6d943e636e5a7
https://doi.org/10.1107/s0021889897001167
https://doi.org/10.1107/s0021889897001167
Autor:
N. N. Novikova, M. V. Kovalchuk, V.A. Howarth, R.I. Cernik, M.C. Petty, A.N. Sosphenov, S. I. Zheludeva, S.P. Collins
Publikováno v:
Materials Science and Engineering: C. 3:211-214
Combined measurements of X-ray reflectivity and characteristic fluorescence yield from investigated ions excited by the primary beam give a unique opportunity for determination of the ion position in the organic system in the direction normal to the
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::89a874836954879346d3046bce00e1dc
https://doi.org/10.1016/0928-4931(95)00073-9
https://doi.org/10.1016/0928-4931(95)00073-9
Autor:
A.N. Sosphenov, S. I. Zheludeva, S.P. Collins, M. V. Kovalchuk, A. D. Akhsakhalyan, N. N. Novikova, R.I. Cernik, N.N. Salashenko, N.E. Malysheva, Yu.Yu. Platonov
Publikováno v:
Thin Solid Films. 259:131-138
A new technique for measuring the thickness and density of ultra-thin films has been developed. Films of the order of tens of angstroms have been studied by using a combination of X-ray standing waves generated in layered synthetic microstructures (L
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::7463c1d7fa4116e97f090b017f6bfe2c
https://doi.org/10.1016/0040-6090(94)06428-8
https://doi.org/10.1016/0040-6090(94)06428-8
Autor:
M. V. Kovalchuk, N. N. Novikova, A. D. Akhsakhalyan, N.N. Salashenko, N.E. Malysheva, A.N. Sosphenov, Yu.Yu. Platonov, S. I. Zheludeva
Publikováno v:
Journal de Physique III. 4:1581-1587
X-ray waveguide structures consisting of two ultra-thin metal layers with a carbon layer in between them deposited on glass substrate are investigated. The reflectivity as well as fluorescence yield from the different metal layers, are used to elucid
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::f92f46fa232942de7e2ef8a28e856f29
https://doi.org/10.1051/jp3:1994225
https://doi.org/10.1051/jp3:1994225
Autor:
N. N. Salashchenko, N.E. Malysheva, A.N. Sosphenov, Yu.Ya. Platonov, N. N. Novikova, A. D. Akhsakhalyan, S. I. Zheludeva, M. V. Kovalchuk
Publikováno v:
Thin Solid Films. 232:252-255
Information about the structure of organic monolayers of fatty acid salts and phospholipids deposited by the Langmuir-Blodgett technique on layered substrates has been obtained for the first time with the help of amplitude-modulated X-ray standing wa
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::61d6055e1b3510b61f57bf6eab5aa07c
https://doi.org/10.1016/0040-6090(93)90017-j
https://doi.org/10.1016/0040-6090(93)90017-j
Publikováno v:
Journal of Physics D: Applied Physics. 26:A206-A209
New aspects of the advantages of layered synthetic microstructures (LSM) as X-ray standing wave (XSW) generators are discussed. One of them-the possibility to prepare a standing wave pattern with any necessary period by varying the LSM parameters-was
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::5c057647febc253615879146b9dd3a3f
https://doi.org/10.1088/0022-3727/26/4a/043
https://doi.org/10.1088/0022-3727/26/4a/043
Publikováno v:
Journal of Physics D: Applied Physics. 26:A202-A205
The distribution of heavy ions inside a thin LB film and the structure perfection of organic layers have been studied by registering fluorescence excited by X-ray evanescent/standing wave fields under conditions of total external reflection. The poss
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::9fbf80d805706a3a07f5db51ef789320
https://doi.org/10.1088/0022-3727/26/4a/042
https://doi.org/10.1088/0022-3727/26/4a/042
Publikováno v:
Acta Physica Polonica A. 80:811-817
The X-Ray Standing Wave Method (XRSW) was applied for the investigation of the silicon samples implanted with 80 keV Fe and Ni ions. The samples were measured by the XRSW method before and after annealing process. For theoretical calculations the two
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::1344d23fa3661d2416aeeb2f08cfcee9
https://doi.org/10.12693/aphyspola.80.811
https://doi.org/10.12693/aphyspola.80.811
Autor:
N.E. Malysheva, M. V. Kovalchuk, S. I. Zheludeva, N.N. Salashenko, A.N. Sosphenov, Yu.Yu. Platonov, N. N. Novikova, A. D. Akhsakhalyan
Publikováno v:
Physica B: Condensed Matter. 198:259-261
The influence of heat load on the parameters of a metal/carbon bilayer is studied in the case of a laser beam deposited Ni film (10–40 A) sandwiched between carbon layers and subjected to annealing up to 300° C. Variation of Ni layer thickness and
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::ecae18ce3cbf2dff4d0f0d34804602e0
https://doi.org/10.1016/0921-4526(94)90175-9
https://doi.org/10.1016/0921-4526(94)90175-9
