Zobrazeno 1 - 10
of 83
pro vyhledávání: '"A.N. Broers"'
Publikováno v:
IEEE Transactions on Applied Superconductivity. 3:2405-2408
Josephson junctions were produced by electron beam irradiation of patterned YBa/sub 2/Cu/sub 3/O/sub 7- delta / thin film tracks on MgO substrates. Single weak links show Fraunhofer-type critical current behavior as a function of field (I/sub c/(H)),
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::c7c875bb22739520453aa58f47458b4f
https://doi.org/10.1109/77.233417
https://doi.org/10.1109/77.233417
Publikováno v:
Physica B: Condensed Matter. :119-120
Results are presented on a series of junctions with very uniform Josephson current densities. It is found that the unique geometry possible with these junctions produces a field period (ΔB) inversely proportional to the product of the track and junc
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::b2b55211bae1efb9f599a3c2d2c31fb5
https://doi.org/10.1016/0921-4526(94)90389-1
https://doi.org/10.1016/0921-4526(94)90389-1
Autor:
M. Pomerantz, A.N. Broers
Publikováno v:
Thin Solid Films. 99:323-329
We report on the writing of lines with resolution of the order of tens of nanometers in Langmuir-Blodgett films using a high resolution scanning transmission electron microscope. The films were layers of manganese stearate deposited by the Langmuir-B
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::91d41cdb419c56723abc58203d899281
https://doi.org/10.1016/0040-6090(83)90399-1
https://doi.org/10.1016/0040-6090(83)90399-1
Publikováno v:
Proceedings, annual meeting, Electron Microscopy Society of America. 36:343-354
Recent work on electron beam lithography has centered on improving overlay precision, reducing cost per exposure and perfecting electron resists and processes for the fabrication of silicon integrated circuits. These efforts have produced experimenta
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::827f16594b6ac139b6a72d117cc41760
https://doi.org/10.1017/s0424820100070102
https://doi.org/10.1017/s0424820100070102
Autor:
A.N. Broers
Publikováno v:
Applied Physics Letters. 21:499-501
Images of Fresnel fringes have been obtained in the conventional surface scanning electron microscope operating in the transmission mode. These fringes provide a means for critically evaluating instrument resolution, final lens astigmatism, and sourc
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::74b09c685a5ef39a70da024053a38690
https://doi.org/10.1063/1.1654234
https://doi.org/10.1063/1.1654234
Autor:
Christopher Durbin, Michael N. Kozicki, A.E. Owen, Y. Bruynseraede, C. Van Haesendonck, Ali Badakhshan, R.F. O'Connell, A.N. Broers, E. E. Ehrichs, Lino Reggiani, Rik Jonckheere, Marc Cahay, H.L. Grubin, L. S. Van Dyke, Robert Glosser, Vladimir Kozlov, Zhihua Cai, M. McLennan, Michael L. Roukes, Charles J. Brumlik, H. Vloeberghs, Daniel C. Ralph, Y. Khawaja, Robert A. Buhrman, A. Zakery, Jian Liu, G. Y. Hu, Charles R. Martin, M.A. Osman, Alex L. de Lozanne, K. S. Ralls, Adriana Giordana, I. F. Cheng, J. R. McBride, Peter Ewen, Michael J. Tierney, B.P. Van der Gaag, Steve A. Lambert, Axel Scherer, N. Giordano
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::e0b45d2cf494ee19e87ffbaf10bd9e1d
https://doi.org/10.1016/b978-0-12-585000-1.50011-2
https://doi.org/10.1016/b978-0-12-585000-1.50011-2
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