Zobrazeno 1 - 10
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pro vyhledávání: '"A.J. Steinfort"'
Autor:
A.J. Steinfort
Publikováno v:
AGORA Magazine. 6:17-18
Publikováno v:
Surface Science. 409:229-240
The inclusion of refraction effects in kinematic scattering theory provides a powerful tool for describing diffuse scattering by X-ray reflectivity. The theory is applied to multilayers with roughened interfaces. Islands and miscut-induced steps as w
Autor:
Gerald Falkenberg, A.J. Steinfort, Jennifer L. Baker, F. Berg Rasmussen, Mourits Nielsen, Robert Feidenhans'l, L. Lottermoser, P.M.L.O. Scholte, Robert L. Johnson
Publikováno v:
Physica B: Condensed Matter. 248:1-8
Nanoscale clusters are often formed during heteroepitaxial crystal growth. Misfit between the lattice parameter of the substrate and the adsorbate stimulates the formation of regular clusters with a characteristic size. The well-known “hut-clusters
Autor:
A.B. Smits, O.C. Mantel, H. S. J. van der Zant, Cees Dekker, P.M.L.O. Scholte, A.J. Steinfort
Publikováno v:
Physical Review B. 57:12530-12535
Thin films of the charge-density-wave compound Rb 0.30MoO 3 ~blue bronze! have been grown on SrTiO 3~001! substrates. The films have been analyzed with atomic force microscopy and x-ray diffraction. The growth initially proceeds in the three-dimensio
Autor:
Chresten Træholt, H. S. J. van der Zant, Henny W. Zandbergen, Cees Dekker, A.J. Steinfort, O.C. Mantel
Publikováno v:
Physical Review B. 55:4817-4824
Thin films of the model charge-density-wave compound Rb0.30MoO3 ~blue bronze! have been grown using pulsed-laser deposition. Films are single-phase Rb0.30MoO3, and consist of grains with typical sizes on the order of micrometers. The charge-density-w
Publikováno v:
Surface Science. 369:313-320
By means of atomic force microscopy, we have investigated the surfaces of SrTiO 3 (001) substrates (used for the growth of high- T c superconducting films) after different heat treatments. These treatments were (i) annealing in O 3 , (ii) annealing i
Publikováno v:
Thin Solid Films. 289:49-53
The quality of an epilayer is characterized by its in-plane misfit and orientation with respect to the substrate, its out-of-plane cell parameter, its orientation distribution and its in-plane and out-of-plane strains. We adapted the Weissenberg equi
Autor:
A.J. Steinfort, S. Radelaar, A. H. Verbruggen, H. Zandbergen, A. W. Fortuin, Paul F. A. Alkemade
Publikováno v:
Surface Science. 366:285-294
Single-crystalline Al films have been grown by molecular beam epitaxy on a (7 × 7) reconstructed Si(111) surface at 50°C. The 100 nm thick Al films were extensively characterized by X-ray diffraction, transmission electron diffraction and microscop
Publikováno v:
Thin Solid Films. 247:190-194
Long range orientational and short range translational order is revealed by atomic force microscopy for the lattice of the hydrocarbon chains of Cd arachidate Langmuir-Blodgett films. This result is qualitatively in agreement with results previously
Publikováno v:
Thin Solid Films. 244:1078-1082
Submolecular details of the hydrophobic surface of Langmuir-Blodgett films are detected by atomic force microscopy for the first time. The uppermost hydrogen atom is distinguished from the two other hydrogen atoms of the methyl groups.