Zobrazeno 1 - 10
of 52
pro vyhledávání: '"A.J. Garratt-Reed"'
Publikováno v:
Scripta Metallurgica et Materialia. 30:1531-1534
Publikováno v:
Surface and Coatings Technology. 51:45-51
Implantation of reactive elements (REs), such as cerium and yttrium, at doses of 0.5−5 × 10 16 ions cm −2 has been shown to reduce the NiO scale growth rate substantially during the oxidation of nickel in oxygen at 900 °C, at least during 5 h e
Publikováno v:
MRS Proceedings. 338
It is well known that the resistance to electromigration of aluminum-based interconnects is enhanced by alloying with copper. The mechanism is thought to involve the segregation of copper to the grain boundaries. The copper concentration at grain bou
Publikováno v:
Proceedings, annual meeting, Electron Microscopy Society of America. 54:702-703
There is significant current interest in understanding the structure of aperiodic solids, such as originally crystalline material amorphized by ion implantation, impact or application of massive pressures, or deposited amorphous thin films, which occ
Autor:
A.J. Garratt-Reed
Publikováno v:
Proceedings, annual meeting, Electron Microscopy Society of America. 41:374-375
When analyzing a composition profile in a thin foil using a Scanning Transmission Electron Microscope, the measured profile is a convolution of the electron probe diameter, the actual profile and the degree of beam spreading in the sample. While it i
Publikováno v:
Proceedings, annual meeting, Electron Microscopy Society of America. 44:518-519
The addition of so-called “reactive” elements such as yttrium to alloys is known to enhance the protective nature of Cr2O3 or Al2O3 scales. However, the mechanism by which this enhancement is achieved remains unclear. An A.E.M. study has been per
Publikováno v:
Ceramics International. 11:152
Utilizing x-ray microanalysis in samples studied with scanning transmission electron microscopy, segregation of Fe, Cr and Sc has been found at grain boundaries of polycrystalline MgO. Samples studied contain between 500 and 1200 cation ppm of each s
Autor:
A.J. Garratt-Reed, C.E. Lyman
Publikováno v:
Ultramicroscopy. 7:109
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