Zobrazeno 1 - 10
of 49
pro vyhledávání: '"A.E.C. Spargo"'
Publikováno v:
Microscopy of Semiconducting Materials, 1987
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::29f23a3898e8c2819f9beab7045fd289
https://doi.org/10.1201/9781003069621-6
https://doi.org/10.1201/9781003069621-6
Publikováno v:
Acta Crystallographica Section A Foundations of Crystallography. 55:105-111
The retrieval of a unique crystal potential from the scattering matrix {\cal S} in high-energy transmission electron diffraction is discussed. It is shown that, in general, data taken at a single orientation are not sufficient to determine all the el
Publikováno v:
Ultramicroscopy. 55:329-333
The validity domain of a recently proposed iterative scheme for the inversion of the wavefunction of fast electrons after dynamical diffraction in a crystal, which is based on reversal of the multislice algorithm, is investigated by Bloch wave analys
Autor:
M.J. Beeching, A.E.C. Spargo
Publikováno v:
Ultramicroscopy. 52:243-247
A possible method for obtaining the crystal potential by inversion of the complex wavefield at the exit surface of the specimen, based on reversal of the multislice algorithm, is outlined. Results from preliminary testing of the method using computer
Publikováno v:
Ultramicroscopy. 32:299-308
The tuned-voltage effect occurs when zone-axis diffraction emulates symmetrical-two-beam conditions. The nature of the tuned-voltage effect is examined in detail from both the Bloch wave and physical optics (multislice) methods. These methods delinea
Publikováno v:
Physical Review B. 56:9-11
Based on previous work, a knowledge of the defect structures created in diamond is crucial for optimizing the doping of diamond by ion irradiation. In the present work, type Ha diamond has been irradiated with 320keV Xe ions at room temperature. It w
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::17fe3a3d80b196a819c01bf6ebd4e2c8
https://doi.org/10.1016/b978-0-444-82334-2.50201-x
https://doi.org/10.1016/b978-0-444-82334-2.50201-x
Autor:
M.J. Beeching, A.E.C. Spargo
Publikováno v:
Proceedings, annual meeting, Electron Microscopy Society of America. 50:128-129
1. IntroductionSeveral methods of phase retrieval from HRTEM image intensity distributions have been proposed but no standard method has emerged. We report on the results achieved using a technique based on a development of the “focus variation met
Publikováno v:
University of Western Australia
Despite many technical, experimental and in principle difficulties, particularly in regard to radiation damage and stability of the structure at the atomic level, considerable progress has been made in the application of the combined electron microsc
Publikováno v:
Ultramicroscopy. 18:49-62
Several examples of the image-matching technique in HRTEM, involving the detailed comparison of experimental and computer-simulated images, are described. These illustrate the essential difficulty of the exercise and give some guiding criteria for im