Zobrazeno 1 - 10
of 27
pro vyhledávání: '"A.C. Daykin"'
Publikováno v:
Journal of Magnetism and Magnetic Materials. 153:293-301
Two types of cross-tie domain wall seen in a cobalt film have been studied by Foucault imaging in the transmission electron microscope. The images are taken with a contrast-forming aperture that subtends a smaller angle than the angular deflections o
Autor:
A.C Daykin, Amanda K. Petford-Long
Publikováno v:
Ultramicroscopy. 58:365-380
A method of producing quantitative maps of the magnetic induction distribution using a conventional transmission electron microscope (TEM) is presented. The magnetic induction maps are constructed from four series of Foucault images taken with small
Autor:
A.C. Daykin
Publikováno v:
Ultramicroscopy. 55:121-125
This paper presents a report on coherent interference effects in selected-area transmission electron diffraction patterns. In particular, it is shown that the coherent small-angle scatter seen around the centrally transmitted beam from nanocrystallin
Autor:
H.Z. Xiao, A.C. Daykin
Publikováno v:
Ultramicroscopy. 53:325-331
Extra diffractions, produced by stacking faults, of the type 1 3 {422}, {200}, 1 3 [442], 1 2 {113}, 1 2 {133}, 1 2 {115} and 1 3 {115} have been studied in a silicon epilayer. A general analysis to predict these additional diffractions in a diamond
Publikováno v:
Acta Metallurgica et Materialia. 40:S195-S205
Silicide formation has been studied by deposition of Ni and Co on (001) and (111) Si substrates, followed by annealing. NiSi 2 and CoSi 2 , exhibiting both the A (parallel lattices) and B (twin related lattices) type epitaxial relationships, and also
Autor:
Christopher J. Kiely, A.C. Daykin
Publikováno v:
MRS Proceedings. 263
A new method of identifying the interfacial structure in the type-B CoSi2//Si(l11) bicrystal is presented. It involves using the kinematic structure factor equation to calculate the levels of contrast which will arise in darkfield micrographs due to
Publikováno v:
MRS Proceedings. 238
Thin films of CoSi2 have been grown on (111) substrates of Si, and studied using transmission electron microscopy. In 2nm films, steps initially on the substrate were found to be transformed into interfacial dislocations following deposition of the f
Publikováno v:
Journal of Magnetism and Magnetic Materials. :39-40
Magnetic domain structures in thin foils of Nd 2 Fe 14 B have been computed from a one-dimensional model, which enables the domain width, domain wall width and domain magnetization direction to be calculated as functions of foil thickness and crystal
Publikováno v:
Journal of Magnetism and Magnetic Materials. 156:43-44
Using a new imaging technique, which is implemented in a transmission electron microscope, we have obtained magnetic induction maps from a Co/Cr/Co trilayer at different points in the magnetisation cycle. At remanence, the moments are approximately p
Publikováno v:
Proceedings, annual meeting, Electron Microscopy Society of America. 48:574-575
When CoSi2 is grown onto a Si(111) surface it can form in two distinct orientations. A-type CoSi2 has the same orientation as the Si substrate and B-type is rotated by 180° degrees about the [111] surface normal.One method of producing epitaxial CoS