Zobrazeno 1 - 6
of 6
pro vyhledávání: '"A.A.D. de Mattos"'
Autor:
Paulo Fernando Papaleo Fichtner, M. F. Beaufort, F. Schaurich, Shay Reboh, J. F. Barbot, A.A.D. de Mattos
Publikováno v:
Scripta Materialia. 65:1045-1048
We report on the exfoliation mechanisms in light gas implanted Si. Microstructure characterization, extensive statistical analysis and solid mechanics theory show that exfoliation is caused by microcracks growing close to equilibrium pressure for hig
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::a667acee9a6bd7a3cf66a1897ad77e2a
https://doi.org/10.1016/j.scriptamat.2011.09.012
https://doi.org/10.1016/j.scriptamat.2011.09.012
Publikováno v:
Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms. 218:308-312
In the present work we report on significant modifications of the surface structure of Au thin films deposited over polymers induced by heavy ion beam irradiation. Under 2 MeV Au + ion beam irradiation, performed with the target at 200 °C, the combi
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::0f5e98d729476d2a61400f669dab7846
https://doi.org/10.1016/j.nimb.2003.12.016
https://doi.org/10.1016/j.nimb.2003.12.016
Autor:
A. Peeva, A.A.D. de Mattos, Moni Behar, Reinhard Kögler, Wolfgang Skorupa, Peter Werner, Paulo Fernando Papaleo Fichtner
Publikováno v:
Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms. :1090-1094
In the present study, we show that R p /2 related defects can be observed by transmission electron microscopy (TEM). TEM observations on cross-sectional MeV self-ion-implanted Si samples have revealed the presence of a well-defined band of interstiti
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::97db0784e0c95ef203ead22adebf8ced
https://doi.org/10.1016/s0168-583x(99)00992-1
https://doi.org/10.1016/s0168-583x(99)00992-1
Autor:
Alain Declémy, Ricardo Meurer Papaléo, J. F. Barbot, C. P. Bergmann, Paulo Fernando Papaleo Fichtner, A.A.D. de Mattos, M. F. Beaufort, Shay Reboh
Publikováno v:
Journal of Applied Physics. 105:093528
X-ray diffraction measurements as well as electron (scanning and transmission), optical, and atomic force microscopies are used to study the thermally induced stress relief mechanisms in coimplanted H+ and He+ ions into (001) Si substrates at moderat
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::e39f00ba17056f44ebbaa9d95417a17a
https://doi.org/10.1063/1.3116738
https://doi.org/10.1063/1.3116738
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