Zobrazeno 1 - 10
of 32
pro vyhledávání: '"A. Y., Abdul Wahab"'
Autor:
A.A. Khairul Azri, M.S. Mohd Jasni, S.F. Wan Muhamad Hatta, M.A. Islam, Y. Abdul Wahab, S. Mekhilef, P.J. Ker
Publikováno v:
Solar Energy. 259:279-297
Publikováno v:
2022 International Conference on Electrical and Computing Technologies and Applications (ICECTA).
Publikováno v:
Basrah Journal of Surgery, Vol 12, Iss 2, Pp 30-35 (2006)
MANAGEMENT OF SPLENIC ABSCESS Ma’moon A Khalid#, Adnan Y Abdul-Wahab@, Kusai Z Mohammad& # Candidate of FICMS, Al-Sader Teaching Hospital.. @ FRCS Assist.Prof. of Surgery, Dept. Of Surgery, Basrah College of Medicine.&CABS, General Surgeon, Al-Sade
Externí odkaz:
https://doaj.org/article/2f3bf126ef9649b4a0157424412c472a
Publikováno v:
Basrah Journal of Surgery, Vol 12, Iss 2, Pp 24-29 (2006)
PRESERVATION TECHNIQUE FOR EXTERNAL LARYNGEAL NERVE IN THYROID SURGERY Nassief J Mohammed#, Adnan Y Abdul-Wahab@, Akram A Hassan& # FICMS, CABS General Surgeon, Basrah Teaching Hospital.. @ FRCS Assist.Prof. Surgery, Dept. Of Surgery, Basrah College
Externí odkaz:
https://doaj.org/article/f9e4f52c626f41d2b104b75ef08c78fe
Publikováno v:
Basrah Journal of Surgery, Vol 9, Iss 1, Pp 23-30 (2003)
Externí odkaz:
https://doaj.org/article/3593a2ecdb9f48158463096b13c110a9
Publikováno v:
The Scientific World Journal, Vol 2014 (2014)
We present a simulation study on negative bias temperature instability (NBTI) induced hole trapping in E′ center defects, which leads to depassivation of interface trap precursor in different geometrical structures of high-k PMOSFET gate stacks usi
Externí odkaz:
https://doaj.org/article/18656f93296b428fbb00ae15a31d7355
Autor:
Santheraleka Ramanathan, H. ARahim, Mohamed Nasrun Osman, Y. Abdul Wahab, Mohd Najib Mohd Yasin, Muzammil Jusoh, Subash C. B. Gopinath, T. Sabapathy
Publikováno v:
Applied Physics A. 126
With an approach towards generating a wearable skin hydration detecting system, simple, cheap, and flexible skin hydration sensing strategy was demonstrated here using an interdigitated electrode (IDE) coated with polydimethylsiloxane (PDMS) matrix.
Publikováno v:
2020 IEEE International Conference on Semiconductor Electronics (ICSE).
This paper investigates the effects of Negative Bias Temperature Instability (NBTI) & Positive Bias Temperature Instability (PBTI) on 2-to-1 multiplexer circuit performances. The key objective of this research is to analyse the effects of NBTI and PB
Publikováno v:
Microelectronics Reliability. 126:114325
Autor:
Adnan Y. Abdul Wahab
Publikováno v:
Basrah Journal of Surgery, Vol 11, Iss 1, Pp 130-130 (2005)
Obituary
Externí odkaz:
https://doaj.org/article/e2f5105d6958475d986cd1b9596ae7ae