On rectifiability of Delone sets in intermediate regularity

Autor: Inoquio-Renteria, Irene, Viera, Rodolfo

In this work, we deal with Delone sets and their rectifiability under different classes of regularity. By pursuing techniques developed by Rivi\`ere and Ye, and Aliste-Prieto, Coronel and Gambaudo, we give sufficient conditions for a Delone set to be

Externí odkaz: http://arxiv.org/abs/2410.14933

Simulating Monolithic Active Pixel Sensors: A Technology-Independent Approach Using Generic Doping Profiles

Autor: Wennlöf, Håkan, Dannheim, Dominik, Viera, Manuel Del Rio, Dort, Katharina, Eckstein, Doris, Feindt, Finn, Gregor, Ingrid-Maria, Huth, Lennart, Lachnit, Stephan, Mendes, Larissa, Rastorguev, Daniil, Daza, Sara Ruiz, Schütze, Paul, Simancas, Adriana, Snoeys, Walter, Spannagel, Simon, Stanitzki, Marcel, Tomal, Alessandra, Velyka, Anastasiia, Vignola, Gianpiero

The optimisation of the sensitive region of CMOS sensors with complex non-uniform electric fields requires precise simulations, and this can be achieved by a combination of electrostatic field simulations and Monte Carlo methods. This paper presents

Externí odkaz: http://arxiv.org/abs/2408.00027

[Translated article] What Proportion of the Spanish Dermatology Caseload Corresponds to Primarily Sexually Transmitted Infections and Other Anogenital Dermatoses? Results From the DIADERM National Random Survey

Autor: A. Martin-Gorgojo, A. Comunión-Artieda, M.Á. Descalzo-Gallego, S. Arias-Santiago, A. Molina-Leyva, Y. Gilaberte, P. Fernández-Crehuet, H. Husein-ElAhmed, A. Viera-Ramírez, P. Fernández-Peñas, R. Taberner, A. Buendía-Eisman, I. García-Doval

Publikováno v: Actas Dermo-Sifiliográficas, Vol 113, Iss 1, Pp T22-T29 (2022)

Background and objective: Predominantly sexually transmitted infections (STIs) and infestations and other anogenital dermatoses are covered in the training of specialists in dermatology and venereology in Spain. This study aimed to analyze the propor

Externí odkaz: https://doaj.org/article/a42cbe6716dd4f8d9c3872c1836b6761

Characterisation of analogue Monolithic Active Pixel Sensor test structures implemented in a 65 nm CMOS imaging process

Autor: Rinella, Gianluca Aglieri, Alocco, Giacomo, Antonelli, Matias, Baccomi, Roberto, Beole, Stefania Maria, Blidaru, Mihail Bogdan, Buttwill, Bent Benedikt, Buschmann, Eric, Camerini, Paolo, Carnesecchi, Francesca, Chartier, Marielle, Choi, Yongjun, Colocci, Manuel, Contin, Giacomo, Dannheim, Dominik, De Gruttola, Daniele, Viera, Manuel Del Rio, Dubla, Andrea, di Mauro, Antonello, Donner, Maurice Calvin, Eberwein, Gregor Hieronymus, Egger, Jan, Fabbietti, Laura, Feindt, Finn, Gautam, Kunal, Gernhaeuser, Roman, Glover, James Julian, Gonella, Laura, Grodaas, Karl Gran, Gregor, Ingrid-Maria, Hillemanns, Hartmut, Huth, Lennart, Ilg, Armin, Isakov, Artem, Jones, Daniel Matthew, Junique, Antoine, Kaewjai, Jetnipit, Keil, Markus, Kim, Jiyoung, Kluge, Alex, Kobdaj, Chinorat, Kotliarov, Artem, Kittimanapun, Kritsada, Křížek, Filip, Kucharska, Gabriela, Kushpil, Svetlana, La Rocca, Paola, Laojamnongwong, Natthawut, Lautner, Lukas, Lemmon, Roy Crawford, Lemoine, Corentin, Li, Long, Librizzi, Francesco, Liu, Jian, Macchiolo, Anna, Mager, Magnus, Marras, Davide, Martinengo, Paolo, Masciocchi, Silvia, Mattiazzo, Serena, Menzel, Marius Wilm, Mulliri, Alice, Mylne, Mia Rose, Piro, Francesco, Rachevski, Alexandre, Rasà, Marika, Rebane, Karoliina, Reidt, Felix, Ricci, Riccardo, Daza, Sara Ruiz, Saccà, Gaspare, Sanna, Isabella, Sarritzu, Valerio, Schlaadt, Judith, Schledewitz, David, Scioli, Gilda, Senyukov, Serhiy, Simancas, Adriana, Snoeys, Walter, Spannagel, Simon, Šuljić, Miljenko, Sturniolo, Alessandro, Tiltmann, Nicolas, Trifirò, Antonio, Usai, Gianluca, Vanat, Tomas, Van Beelen, Jacob Bastiaan, Varga, Laszlo, Verdoglia, Michele, Vignola, Gianpiero, Villani, Anna, Wennloef, Haakan, Witte, Jonathan, Wittwer, Rebekka Bettina

Analogue test structures were fabricated using the Tower Partners Semiconductor Co. CMOS 65 nm ISC process. The purpose was to characterise and qualify this process and to optimise the sensor for the next generation of Monolithic Active Pixels Sensor

Externí odkaz: http://arxiv.org/abs/2403.08952

Simulations and Performance Studies of a MAPS in 65 nm CMOS Imaging Technology

Autor: Simancas, Adriana, Braach, Justus, Buschmann, Eric, Chauhan, Ankur, Dannheim, Dominik, Viera, Manuel Del Rio, Dort, Katharina, Eckstein, Doris, Feindt, Finn, Gregor, Ingrid-Maria, Hansen, Karsten, Huth, Lennart, Mendes, Larissa, Mulyanto, Budi, Rastorguev, Daniil, Reckleben, Christian, Daza, Sara Ruiz, Schlaadt, Judith, Schütze, Paul, Snoeys, Walter, Spannagel, Simon, Stanitzki, Marcel, Velyka, Anastasiia, Vignola, Gianpiero, Wennlöf, Håkan

Monolithic active pixel sensors (MAPS) produced in a 65 nm CMOS imaging technology are being investigated for applications in particle physics. The MAPS design has a small collection electrode characterized by an input capacitance of ~fF, granting a

Externí odkaz: http://arxiv.org/abs/2402.14524