Zobrazeno 1 - 10
of 231
pro vyhledávání: '"A. V. Tikhonravov"'
Publikováno v:
Nanomaterials, Vol 12, Iss 18, p 3242 (2022)
A systematic study of the most significant parameters of the ion-assisted deposited silicon dioxide films is carried out using the classical molecular dynamics method. The energy of the deposited silicon and oxygen atoms corresponds to the thermal ev
Externí odkaz:
https://doaj.org/article/ff66056f2a7c46a49dd2cfb5455035aa
Publikováno v:
Lobachevskii Journal of Mathematics. 43:1277-1284
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::724609c9e0ed2a06515128c5ae5b8ed7
https://doi.org/10.1134/s1995080222080303
https://doi.org/10.1134/s1995080222080303
Publikováno v:
Lobachevskii Journal of Mathematics. 43:857-863
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::52fe6b1fcb9b4f3461d036770529f2a5
https://doi.org/10.1134/s1995080222070137
https://doi.org/10.1134/s1995080222070137
Autor:
T. F. Isaev, Iu. S. Lagutin, A. A. Lagutina, D. V. Lukyanenko, O. F. Prosovskiy, A. V. Tikhonravov, A. G. Yagola
Publikováno v:
Moscow University Physics Bulletin. 76:356-362
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::2007b09b858b34d82d51f12a3a16a299
https://doi.org/10.3103/s002713492105009x
https://doi.org/10.3103/s002713492105009x
Autor:
V. P. Zhupanov, Vladimir B. Sulimov, Fedor V. Grigoriev, D. A. Chesnokov, Alexander V. Tikhonravov
Publikováno v:
Lobachevskii Journal of Mathematics. 42:1514-1520
Using the classical molecular dynamics method, the influence of absorption of laser radiation on heat transfer and temperature distribution in silicon dioxide thin films is studied. It is revealed that heating the film to a temperature close to the m
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::62856bb43447a67eb86c8b1061715a6c
https://doi.org/10.1134/s199508022107009x
https://doi.org/10.1134/s199508022107009x
Autor:
Siyu Dong, Zhanyi Zhang, Lingyun Xie, Jingyuan Zhu, Haigang Liang, Zeyong Wei, Yuzhi Shi, Alexander V. Tikhonravov, Zhanshan Wang, Lei Zhou, Xinbin Cheng
Publikováno v:
Optica. 10:585
Littrow diffraction, the ability to reflect light back along incident direction, is a key functionality of retroreflectors, exhibiting wide applications in nanophotonics. However, retroreflectors have hitherto low working efficiencies and narrow band
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::b6335c3a25be2f96af34b019a8138fef
https://doi.org/10.1364/optica.486332
https://doi.org/10.1364/optica.486332
Publikováno v:
Moscow University Physics Bulletin. 76:36-41
The correlation of errors for various broadband optical monitoring strategies for controlling deposition of multilayer coatings, including strategies with replaceable monitoring chips, is investigated. It is shown that it is necessary to take into ac
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::3662ee58f260fc97f01de02ca1a59b83
https://doi.org/10.3103/s0027134921010070
https://doi.org/10.3103/s0027134921010070
Autor:
Igor V. Kochikov, Anatoly G. Yagola, Alexander V. Tikhonravov, Dmitry Lukyanenko, A. A. Lagutina, Yu. S. Lagutin
Publikováno v:
Computational Mathematics and Mathematical Physics. 60:2056-2063
For optical monitoring of layer thickness in the deposition of multilayer optical coatings, a stable method is proposed that completely eliminates the cumulative effect of errors in the thicknesses of deposited layers. The considered monitoring metho
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::8ff5fff886873825da1988888dbd00cf
https://doi.org/10.1134/s0965542520120064
https://doi.org/10.1134/s0965542520120064
Autor:
A. A. Lagutina, Igor V. Kochikov, I. S. Lagutin, Alexander V. Tikhonravov, Anatoly G. Yagola, Dmitry Lukyanenko, S.A. Sharapova
Publikováno v:
Moscow University Physics Bulletin. 75:578-584
The paper presents a theoretical study of the correlation of errors in the thickness of layers of multilayer optical coatings produced using monochromatic monitoring of the deposition process. Estimates of the degree of error correlation in layer thi
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::869109d7378bc419f0e8bc3ffa65c984
https://doi.org/10.3103/s0027134920060193
https://doi.org/10.3103/s0027134920060193
Publikováno v:
Journal of Inverse and Ill-posed Problems. 28:915-921
On-line optical monitoring of multilayer coating production requires solving inverse identification problems of determining the thicknesses of coating layers. Regardless of the algorithm used to solve inverse problems, the errors in the thicknesses o
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::cc39ab0acbf43645d5b43ca0bda51c25
https://doi.org/10.1515/jiip-2020-0079
https://doi.org/10.1515/jiip-2020-0079