Zobrazeno 1 - 10
of 21
pro vyhledávání: '"A. V. Ilinskiy"'
Publikováno v:
Аграрная наука Евро-Северо-Востока, Vol 25, Iss 4 (2024)
Flood sedimentation in conditions of regular floodplain flooding is a key factor in the formation of alluvial soil. The nature of the passage of hollow waters and their composition affect the quantitative and qualitative characteristics of flood sedi
Externí odkaz:
https://doaj.org/article/bf0ca3b42b6246db911ea5a1d945d64b
Autor:
I. V. Mosharova, V. V. Ilinskiy, I. A. Kozlova, A. Y. Akylova, K. P. Hazanova, S. A. Mosharov
Publikováno v:
Doklady Biological Sciences. 503:58-62
Publikováno v:
Inland Water Biology. 15:1-10
Autor:
A. V. Ilinskiy, V. N. Selmen, E. V. Selmen, S. D. Karyakina, M. S. Matyukhin, V. V. Grebennikova
Publikováno v:
Theoretical and Applied Ecology. :191-197
Autor:
Rene Alehandro Castro Arata, Aleksandr V. Ilinskiy, Vladimir A. Klimov, Marina E. Pashkevich, Evgeniy B. Shadrin
Publikováno v:
Physics of Complex Systems. 3:43-50
Publikováno v:
Physics of Complex Systems. 3:202-213
Autor:
Aleksandr V. Ilinskiy, Rene Alejandro Castro Arata, Lydia M. Smirnova, E. B. Shadrin, M. E. Pashkevich
Publikováno v:
Physics of Complex Systems, Vol 2, Iss 1 (2021)
The results of studying the processes of dielectric relaxation in thin nanocrystalline films of vanadium dioxide are presented. The existence of a non-Debye relaxation process was revealed, which is due to the presence of a distribution of relaxators
Publikováno v:
Kontrol'. Diagnostika. :65-71
The article discusses the features of the method for assessing the hardness of coating materials based on the dynamic indentation approach, the essence of which is the continuous registration of the process of contact interaction of the indenter with
Publikováno v:
Semiconductors. 54:403-411
The frequency dependences of the dissipation factor tanδ(f) and the Cole–Cole diagrams for germanium- and magnesium-doped vanadium-dioxide films in the range of 0.1–106 Hz are obtained. Measurements at temperatures between 173–373 K are perfor
Publikováno v:
Semiconductors. 54:205-211
In the range of 0.1–106 Hz, the temperature-induced transformation of the frequency dependences of the dielectric-loss tangent tanδ(f) as well as the Cole–Cole diagrams for undoped vanadium-dioxide films are investigated. The measurements are ca