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pro vyhledávání: '"A. U. Dorofeev"'
Autor:
E. M. Temper, I. B. Gulyaev, A. U. Dorofeev, N. B. Gladisheva, K. L. Enisherlova, V. G. Goryachev
Publikováno v:
SPIE Proceedings.
Nondestructive diagnostic method was developed for epitaxial heterostructure quality prediction. Such prediction is very important for production of some types HF FETs. The various heterostructure modifications grown on sapphire substrates have been