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of 783
pro vyhledávání: '"A. Tselev"'
Autor:
Tselev, Alexander
Scanning Thermal Microscopy (SThM) is a scanning probe technique aimed at quantitative characterization of local thermal properties at the length scale down to tens of nanometers. With many probe designs and approaches to interpretation of probe resp
Externí odkaz:
http://arxiv.org/abs/2409.06872
Autor:
Neumayer, Sabine M., Ievlev, Anton V., Tselev, Alexander, Basun, Sergey A., Conner, Benjamin S., Susner, Michael A., Maksymovych, Petro
Smart electronic circuits that support neuromorphic computing on the hardware level necessitate materials with memristive, memcapacitive, and neuromorphic-like functional properties; in short, the electronic response must depend on the voltage histor
Externí odkaz:
http://arxiv.org/abs/2208.12734
Autor:
Guo, Hongxuan, Yulaev, Alexander, Strelcov, Evgheni, Tselev, Alexander, Arble, Christopher, Vladar, Andras E., Villarrubia, John S., Kolmakov, Andrei
Electrical double layers play a key role in a variety of electrochemical systems. The mean free path of secondary electrons in aqueous solutions is on the order of a nanometer, making them suitable for probing of ultrathin electrical double layers at
Externí odkaz:
http://arxiv.org/abs/2006.04283
Charge carrier transport through the probe-sample junction can have substantial consequences for outcomes of electrical and electromechanical atomic-force-microscopy (AFM) measurements. For understanding physical processes under the probe, we carried
Externí odkaz:
http://arxiv.org/abs/2005.00655
Autor:
Neumayer, Sabine M., Saremi, Sahar, Martin, Lane W., Collins, Liam, Tselev, Alexander, Jesse, Stephen, Kalinin, Sergei V., Balke, Nina
Piezoresponse force microscopy (PFM) is a powerful characterization technique to readily image and manipulate ferroelectrics domains. PFM gives insight into the strength of local piezoelectric coupling as well as polarization direction through PFM am
Externí odkaz:
http://arxiv.org/abs/1912.03257
Akademický článek
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Autor:
Vlcek, Lukas, Ziatdinov, Maxim A., Tselev, Alexander, Baddorf, Arthur P., Kalinin, Sergei V., Vasudevan, Rama K.
Materials characterization and property measurements are a cornerstone of material science, providing feedback from synthesis to applications. Traditionally, a single sample is used to derive information on a single point in composition space, and im
Externí odkaz:
http://arxiv.org/abs/1806.07475
Autor:
Neumayer, Sabine M., Eliseev, Eugene A., Susner, Michael A., Tselev, Alexander, Rodriguez, Brian J., Brehm, John A., Pantelides, Sokrates T., Panchapakesan, Ganesh, Jesse, Stephen, Kalinin, Sergei V., McGuire, Michael A., Morozovska, Anna N., Maksymovych, Petro, Balke, Nina
Publikováno v:
Phys. Rev. Materials 3, 024401 (2019)
The interest in ferroelectric van der Waals crystals arises from the potential to realize ultrathin ferroic systems owing to the reduced surface energy of these materials and the layered structure that allows for exfoliation. Here, we quantitatively
Externí odkaz:
http://arxiv.org/abs/1803.08142
Autor:
Nemšák, Slavomír, Strelcov, Evgheni, Guo, Hongxuan, Hoskins, Brian D., Duchoň, Tomáš, Mueller, David N., Yulaev, Alexander, Vlassiouk, Ivan, Tselev, Alexander, Schneider, Claus M., Kolmakov, Andrei
Recent developments in environmental and liquid cells equipped with electron transparent graphene windows have enabled traditional surface science spectromicroscopy tools, such as X-ray photoelectron spectroscopy (XPS), photoemission electron microsc
Externí odkaz:
http://arxiv.org/abs/1802.02545
Autor:
Balke, Nina, Jesse, Stephen, Carmichael, Ben, Okatan, M. Baris, Kravchenko, Ivan I., Kalinin, Sergei V., Tselev, Alexander
Atomic Force Microscopy (AFM) methods utilizing resonant mechanical vibrations of cantilevers in contact with a sample surface have shown sensitivities as high as few picometers for detecting surface displacements. Such a high sensitivity is harnesse
Externí odkaz:
http://arxiv.org/abs/1610.03635