Zobrazeno 1 - 10
of 449
pro vyhledávání: '"A. Simonaitis"'
Autor:
Simonaitis, John W., Alongi, Joseph A., Slayton, Benjamin, Putnam, William P., Berggren, Karl K., Keathley, Phillip D.
This work demonstrates electron energy loss spectroscopy of 2D materials in a 1-30 keV electron microscope, observing 100-times stronger electron-matter coupling relative to 125 keV microscopes. We observe that the universal curve relating beam energ
Externí odkaz:
http://arxiv.org/abs/2410.09291
Autor:
Koppell, Stewart A., Simonaitis, John W., Krielaart, Maurice A. R., Putnam, William P., Berggren, Karl K., Keathley, Phillip D.
We analytically describe the noise properties of a heralded electron source made from a standard electron gun, a weak photonic coupler, a single photon counter, and an electron energy filter. We argue the traditional heralding figure of merit, the Kl
Externí odkaz:
http://arxiv.org/abs/2406.18755
Autor:
Sabhlok, Sanchit, Wright, Shelley A., Vayner, Andrey, Simonaitis-Boyd, Sonata, Murray, Norman, Armus, Lee, Cosens, Maren, Wiley, James, Kriek, Mariska
We present results from the ``Quasar hosts Unveiled by high Angular Resolution Techniques" (QUART) survey studying the Circumgalactic Medium (CGM) by observing rest-frame UV emission lines Ly$\alpha$, C IV and He II around two radio-loud quasars, 3C
Externí odkaz:
http://arxiv.org/abs/2401.04284
Autor:
Batson, Emma, Colangelo, Marco, Simonaitis, John, Gebremeskel, Eyosias, Medeiros, Owen, Saravanapavanantham, Mayuran, Bulovic, Vladimir, Keathley, P. Donald, Berggren, Karl K.
Absorption of light in superconducting electronics is a major limitation on the quality of circuit architectures that integrate optical components with superconducting components. A 10 nm thick film of a typical superconducting material like niobium
Externí odkaz:
http://arxiv.org/abs/2212.08573
Scanning electron microscopy (SEM) is a versatile technique used to image samples at the nanoscale. Conventional imaging by this technique relies on finding the average intensity of the signal generated on a detector by secondary electrons (SEs) emit
Externí odkaz:
http://arxiv.org/abs/2111.01862
Autor:
Simonaitis, John W., Slayton, Benjamin, Yang-Keathley, Yugu, Keathley, Phillip D., Berggren, Karl K.
In this work, we report the use of commercial Gallium Nitride (GaN) power electronics to precisely switch complex distributed loads, such as electron lenses and deflectors, without impedance matching. Depending on the chosen GaN field effect transist
Externí odkaz:
http://arxiv.org/abs/2102.03271
Electrostatic electron mirror in SEM for simultaneous imaging of top and bottom surfaces of a sample
Autor:
Abedzadeh, Navid, Krielaart, M. A. R., Kim, Chung-Soo, Simonaitis, John, Hobbs, Richard, Kruit, Pieter, Berggren, Karl K.
The use of electron mirrors in aberration correction and surface-sensitive microscopy techniques such as low-energy electron microscopy has been established. However, in this work, by implementing an easy to construct, fully electrostatic electron mi
Externí odkaz:
http://arxiv.org/abs/2012.09902
Scanning electron microscopy is a powerful tool for nanoscale imaging of organic and inorganic materials. An important metric for characterizing the limits of performance of these microscopes is the Detective Quantum Efficiency (DQE), which measures
Externí odkaz:
http://arxiv.org/abs/2008.01917
Publikováno v:
In The Journal of Prosthetic Dentistry April 2023 129(4):589-596
Publikováno v:
In Ultramicroscopy March 2023 245