Zobrazeno 1 - 10
of 81
pro vyhledávání: '"A. Salahouelhadj"'
Publikováno v:
In Microelectronic Engineering 1 March 2023 271-272
Autor:
Tsau, Yan Wen, De Messemaeker, Joke, Salahouelhadj, Abdellah, Gonzalez, Mario, Witters, Liesbeth, Zhang, Boyao, Seefeldt, Marc, Beyne, Eric, De Wolf, Ingrid
Publikováno v:
In Microelectronics Reliability November 2022 138
Publikováno v:
In Thin Solid Films 1 October 2022 759
Publikováno v:
In International Journal of Solids and Structures 15 March 2015 56-57:96-117
Publikováno v:
In Microelectronics Reliability January 2014 54(1):204-213
Publikováno v:
2022 IEEE 72nd Electronic Components and Technology Conference (ECTC).
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::5f6308d4fa2df5fbcdbb20c04dd9cd01
https://doi.org/10.1109/ectc51906.2022.00268
https://doi.org/10.1109/ectc51906.2022.00268
Publikováno v:
Microelectronic Engineering. :111947
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::4b79960269c3fea094cf027fab0495ae
https://doi.org/10.1016/j.mee.2023.111947
https://doi.org/10.1016/j.mee.2023.111947
Autor:
Yan Wen Tsau, Joke De Messemaeker, Abdellah Salahouelhadj, Mario Gonzalez, Liesbeth Witters, Boyao Zhang, Marc Seefeldt, Eric Beyne, Ingrid De Wolf
Publikováno v:
Microelectronics Reliability. 138:114716
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::ac9a67ab7ad62a79983dc57dc5d48102
https://doi.org/10.1016/j.microrel.2022.114716
https://doi.org/10.1016/j.microrel.2022.114716
Publikováno v:
Thin Solid Films. 759:139467
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::40b8ea6685648af65fcf2accd0a1e9e1
https://doi.org/10.1016/j.tsf.2022.139467
https://doi.org/10.1016/j.tsf.2022.139467
Autor:
Salahouelhadj, A., Haddadi, H.
Publikováno v:
In Computational Materials Science 2010 48(3):447-455