Zobrazeno 1 - 10
of 68
pro vyhledávání: '"A. Paschin"'
Autor:
I. O. Akhundov, Alexander E. Klimov, S. P. Suprun, E. V. Fedosenko, D. V. Ishchenko, V. N. Sherstyakova, Igor G. Neizvestny, A. S. Tarasov, Nikolai S. Paschin, A. N. Akimov, Oleg E. Tereshchenko
Publikováno v:
Semiconductors. 54:951-955
The dependence of the photoconductivity sign on the bias voltage, intensity, and duration of illumination is studied for PbSnTe:In films in the space-charge-limited current regime. The role of traps (including surface ones) with a complex energy spec
Autor:
Denis V. Ishchenko, Alexey Nikolaevich Akimov, Nikolay Sergeevich Paschin, Alexandr Eduardovich Klimov, Oleg Evgenievich Tereshchenko, V. N. Sherstyakova, Evgenij Vladimirovich Fedosenko
Publikováno v:
Key Engineering Materials. 806:3-9
The effect of surface chemical treatment on current-voltage (IV) characteristics of high-resistance MBE-grown PbSnTe:In films in space charge limited current (SCLC) regimes has been studied. At T=4.2 K depending on surface chemical treatment the curr
Autor:
null Tereshchenko O. E., null Suprun S. P., null Paschin N. S., null Sidorov G. Yu., null Neizvestny I. G., null Matyushenko E. V., null Gorshkon D. V., null Golyashov V. A., null Klimov A. E.
Publikováno v:
Semiconductors. 56:182
Results on the creation and properties of transistor-type MIS structures (MIST) with an Al2O3 thin-film gate dielectric based on PbSnTe : In films obtained by molecular beam epitaxy are presented. The source-drain current-voltage characteristics (CVC
Akademický článek
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Autor:
A. N. Akimov, M. L. Savchenko, V. S. Epov, Alexander E. Klimov, Nikolai S. Paschin, E. V. Fedosenko, A. S. Yaroshevich
Publikováno v:
Semiconductors. 51:1522-1526
PbSnTe:In films with a long-wavelength sensitivity limit of over 20 μm and low “dark” conductivity are studied. The spectral dependences of the photoconductivity obtained at different temperatures using a Fourier spectrometer are compared with d
Autor:
Denis V. Ishchenko, Artem N. Papantonopulo, V. N. Sherstyakova, Nikolai S. Paschin, Alexander E. Klimov, A. N. Akimov
Publikováno v:
2017 18th International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices (EDM).
The experimental results on photoconductivity of PbSnTe:In films in the case of interband excitation under variable light conditions with the fixation of the photocurrent are discussed in the paper. It is shown that a decrease in luminance by more th
Autor:
Nikolai S. Paschin, Denis V. Ishchenko, Andrey S. Tarasov, V. N. Sherstyakova, A. N. Akimov, Alexander E. Klimov
Publikováno v:
2017 18th International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices (EDM).
Method of producing planar patterns (p+-i-p+, p+-i-n+) based on thin films of Pb 1−x Sn x Te:In is described. Experimental measurements of stationary and transient photoconductivity at liquid-helium temperatures are presented only for p+-i-p+ struc
Publikováno v:
Advanced Materials Research. 996:386-391
An electrode system for inducing a high density pulsed electric current (PEC) into the material for residual stresses (RS) relaxation has been proposed. A new non-destructive technology for determination of RS using electron speckle interferometry in
Publikováno v:
Journal of Physics: Conference Series. 946:012016
The analysis of experimental data on the observation of photoresponse in narrow gap semiconductor Pb1?x Sn x Te:In films grown by the method of molecular beam epitaxy, exposing samples to the powerful radiation of the Novosibirsk free electron laser
Akademický článek
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