Zobrazeno 1 - 2
of 2
pro vyhledávání: '"A. P. v. Rosenstiel"'
Autor:
K. H. Berresheim, W. H. J. Bruis, O. A. Koeiman, A. P. v. Rosenstiel, P. R. Mertens, G. H. van Os
Publikováno v:
Fresenius' Zeitschrift für analytische Chemie. 333:535-539
The nature and origin of harmful surface contaminants of spent Pt-10%Rh catalyst gauzes was determined by HR-SEM, ESCA, SIMS and XRD. Based on the analytical results the degree of surface contamination could be greatly reduced. Together with an appro
An Electron Microprobe Analysis of Cu2−x Layers Chemiplated on Single Crystals and Thin Films of CdS
Autor:
J. J. Loferski, A. P. v. Rosenstiel, K. K. Reinhartz, M. Fabbricotti, A. v. Aerschodt, A. P. Voskamp
Publikováno v:
Vth International Congress on X-Ray Optics and Microanalysis / V. Internationaler Kongreß für Röntgenoptik und Mikroanalyse / Ve Congrès International sur l’Optique des Rayons X et la Microanalyse ISBN: 9783662228456
Vth International Congress on X-Ray Optics and Microanalysis / V. Internationaler Kongreß für Röntgenoptik und Mikroanalyse / Ve Congrès International sur l’Optique des Rayons X et la Microanalyse ISBN: 9783662121108
Vth International Congress on X-Ray Optics and Microanalysis / V. Internationaler Kongreß für Röntgenoptik und Mikroanalyse / Ve Congrès International sur l’Optique des Rayons X et la Microanalyse ISBN: 9783662121108
The cupreous sulphide barrier layer in cadmium sulphide solar cells was investigated using an electron microprobe. In typical high efficiency thin film cells the cupreous sulphide was relatively homogeneous and its average thickness was approximately
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::6ac2ec435444296cbc83abb6e5a2efb3
https://doi.org/10.1007/978-3-662-24778-5_75
https://doi.org/10.1007/978-3-662-24778-5_75