Zobrazeno 1 - 10
of 20
pro vyhledávání: '"A. Mohades-Kassai"'
Publikováno v:
Journal of Communications. :1134-1140
Service orchestration is an essential activity in 5G networks. It performs optimal resource allocation and provisions services in an effective sequence based on demands across a collection of physical or virtual network functions (P/VNF). This paper
Publikováno v:
Journal of Applied Sciences. 8:2569-2576
Publikováno v:
Journal of Applied Sciences. 8:1841-1849
Autor:
R. Addinall, R.C. Newman, Ian T. Ferguson, M.J.L. Sangster, M.R. Brozel, V. K. M. Sharma, D. McPhail, A. Mohades-Kassai
Publikováno v:
Materials Science Forum. :1027-1032
Autor:
A. Mohades-Kassai, M.R. Brozel
Publikováno v:
Journal of Crystal Growth. 103:303-310
“Reverse contrast imaging” is a technique that has been developed for imaging dislocation distributions in undoped semi-insulating LEC GaAs. This technique, which relies on the mapping of near-bandgap infrared transmission, is both rapid and non-
Autor:
H.R. Soufi, A. Mohades-Kassai
Publikováno v:
ICM 2000. Proceedings of the 12th International Conference on Microelectronics. (IEEE Cat. No.00EX453).
A thin GaAs Hall effect sensor with good thermal stability has been grown by molecular beam epitaxy (MBE). This sensor transduces magnetic flux to a voltage signal. The Hall effect involves passing a current through a layer of semiconductor when a ma
Autor:
A. Mohades-Kassai
Publikováno v:
ICM 2000. Proceedings of the 12th International Conference on Microelectronics. (IEEE Cat. No.00EX453).
Silicon doping is the most common means of producing n-type GaAs grown by MBE. However, samples grown with an intended carrier concentration of the order of 3/spl times/10/sup 19/ cm/sup -3/ exhibit considerable self-compensation. Localized vibration
Publikováno v:
MRS Proceedings. 421
Optical bandgap thermometry is a new method for measuring the temperature of semiconductor substrates. In this method, the temperature of the substrate is inferred from the wavelength of the onset of transparency of the substrate which is a measure o
Autor:
Mohades-Kassai, A., Soufi, H.R.
Publikováno v:
ICM 2000. Proceedings of the 12th International Conference on Microelectronics. (IEEE Cat. No.00EX453); 2000, p345-348, 4p
Autor:
Mohades-Kassai, A.
Publikováno v:
ICM 2000. Proceedings of the 12th International Conference on Microelectronics. (IEEE Cat. No.00EX453); 2000, p341-344, 4p