Zobrazeno 1 - 10
of 90
pro vyhledávání: '"A. Mitwalsky"'
Autor:
Mitwalsky, Maximilian
Um den Einsatz von Faserverbundwerkstoffen in der Automobilindustrie zu ermöglichen, werden hochautomatisierte und materialdurchsatzstarke Fertigungsprozesse benötigt. Zwar erfüllt der Flechtprozess diese Anforderungen, allerdings führt dessen de
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=od_______518::3663c9ee90530aad954c0549d4dad024
https://mediatum.ub.tum.de/doc/1244755/document.pdf
https://mediatum.ub.tum.de/doc/1244755/document.pdf
Publikováno v:
Journal of Applied Physics; 5/15/1993, Vol. 73 Issue 10, p4942, 9p
Publikováno v:
Journal of Applied Physics; 7/15/1991, Vol. 70 Issue 2, p708, 12p, 6 Black and White Photographs, 1 Diagram, 1 Chart, 11 Graphs
Publikováno v:
Journal of Applied Physics; 7/15/1991, Vol. 70 Issue 2, p693, 15p, 5 Black and White Photographs, 2 Charts, 16 Graphs
Autor:
A. Mitwalsky, W. Kern, David Arthur Bohling, H. Treichel, K. R. Coyle, Andrew P. Lane, G. Tempel, B.S. Felker, N. P. Sandler, M.A. George, G. Zorn
Publikováno v:
Advanced Materials for Optics and Electronics. 5:163-175
Flims of metal oxides, such as Ta2O5, Nb2O5, Al2O3, HfO2, ZrO2 and TiO2 have been fabricated by use of different precursor materials, deposition techniques and annealing techniques. Several analytical methods were applied to study the layers. New dat
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::fc8e9bf1c740dea87113546ff7ec9b19
https://doi.org/10.1002/amo.860050305
https://doi.org/10.1002/amo.860050305
Publikováno v:
Ultramicroscopy. 52:127-140
Special preparation techniques have to be applied for trans-mission electron microscope (TEM) failure analysis of ULSI devices as well as for technology characterization of non-periodic test patterns to obtain information from volumes as small as 1
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::a307c188f7907879a6de628024e42f7b
https://doi.org/10.1016/0304-3991(93)90026-t
https://doi.org/10.1016/0304-3991(93)90026-t
Publikováno v:
Journal of Applied Physics. 73:4942-4950
Ion‐beam‐sputtered and electron‐beam‐evaporated Co/Au multilayers have been investigated with high‐resolution transmission electron microscopy. The multilayers are found to exhibit a strong {111} texture and to contain Co predominantly in t
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::e2a7a63b7db6a34dff3b99cc32795d3c
https://doi.org/10.1063/1.353813
https://doi.org/10.1063/1.353813
Publikováno v:
ChemInform. 22
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::4cf2a200fa3fcc3b99eee6d5f1bc9af1
https://doi.org/10.1002/chin.199149300
https://doi.org/10.1002/chin.199149300
Autor:
K. R. Coyle, G. Zorn, D. A. Bohling, B. S. Felker, W. Kern, H. Treichel, A. P. Lane, G. Tempel, M. George, A. Mitwalsky, N. P. Sandler
Publikováno v:
ChemInform. 26
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::2bc5303cee0ce4d4f5bd07a5c7345a3e
https://doi.org/10.1002/chin.199541014
https://doi.org/10.1002/chin.199541014
Publikováno v:
Advanced Materials for Optics and Electronics. 1:299-308
A laminar flow low-pressure chemical vapour deposition (LPCVD) system (LAM IntegrityTM) has been used to deposit tantalum pentoxide (Ta2O5) from Ta(OEt)5 films in the presence of oxygen (O2) at 470 °C at a typical deposition rate of 4 nm min−1. Un
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::652d41c3f76a44a93f2323011c2a1c78
https://doi.org/10.1002/amo.860010607
https://doi.org/10.1002/amo.860010607