Zobrazeno 1 - 4
of 4
pro vyhledávání: '"A. M. Raransky"'
Publikováno v:
Фізика і хімія твердого тіла, Vol 23, Iss 4, Pp 764-775 (2022)
With the application of a linear theory of elasticity of anisotropic crystals and the use of experimental values of elastic moduli Сij and compliances Sij given in the Landolt-Börstein tables, characteristic surfaces of Young's moduli, angular dist
Externí odkaz:
https://doaj.org/article/dff894bd77a6440abb6f2b0b8b079953
Publikováno v:
SPIE Proceedings.
Among existing x ray diffraction diagnostics nonperfections of crystals the specific location take methods are based on use of x-ray dynamic diffraction effects. From them the most sensitive are based on interferention. The Pendellosung and Moire fri
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::1356c929db566389d2779dfa4d889fbb
https://doi.org/10.1117/12.226734
https://doi.org/10.1117/12.226734
Publikováno v:
SPIE Proceedings.
The scheme of x-ray diffraction on reflection for research of layers structure of single crystals after various kinds of external treatment is used. On a series of diffraction curves the profiles of distribution of deformations in thin subsurface are
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::097e59f332b37682afe3bbb07f084cdc
https://doi.org/10.1117/12.226722
https://doi.org/10.1117/12.226722
Publikováno v:
SPIE Proceedings.
There are more than a dozen different methods of diagnostic and control of the structural purity of materials which are used in modern micro- and optoelectronics. Each of them has their own strong and weak points, range and fields of use. Usually a c
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::bffb8036245b344db67dd4d126dcdca5
https://doi.org/10.1117/12.165401
https://doi.org/10.1117/12.165401