Zobrazeno 1 - 10
of 17
pro vyhledávání: '"A. M. Makarenkov"'
Publikováno v:
PROGRAMMNAYA INGENERIA. 10:400-416
Publikováno v:
Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques. 12:80-86
Algorithms for using the Galerkin projection method and the projection least squares method to analyze the three-dimensional model of the diffusion of minority charge carriers generated by an electron probe in a semiconductor material are presented.
Publikováno v:
Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques. 11:981-986
In this paper, the results of using the Galerkin projection method to model the spatial distribution of minority charge carriers generated by an electron probe in a semiconductor material are presented. The problem is solved in the cylindrical coordi
Publikováno v:
Computational Mathematics and Mathematical Physics. 57:802-814
Using the diffusion equation as an example, results of applying the projection Galerkin method for solving time-independent heat and mass transfer equations in a semi-infinite domain are presented. The convergence of the residual corresponding to the
Publikováno v:
Journal of Surface Investigation. X-ray, Synchrotron and Neutron Techniques. 10:445-449
The results of estimating different projection approximation schemes (a modified least-squares method and the Galerkin and Ritz methods) are presented. They are used to simulate the distribution of minority charge carriers, which is observed as a res
Publikováno v:
Поверхность. Рентгеновские, синхротронные и нейтронные исследования. :88-93
Publikováno v:
Journal of Surface Investigation. X-ray, Synchrotron and Neutron Techniques. 9:929-933
Some possibilities of using a new method for the continuous approximation of step functions are considered. It is based on using trigonometric expressions in the form of recursive functions. For a model of independent sources, a second-order differen
Publikováno v:
Journal of Surface Investigation. X-ray, Synchrotron and Neutron Techniques. 8:922-925
A modified model of the diffusion of minority charge carriers generated by a broad electron beam in semiconductor materials is proposed. New methods for the approximation of step functions are used, and an estimate of the stability of solutions to th
Publikováno v:
Journal of Surface Investigation. X-ray, Synchrotron and Neutron Techniques. 7:1077-1080
A modified projection scheme of the least-squares method is considered for modeling of the distribution of minority charge carriers generated by an electron beam in a homogeneous semiconductor material. The order estimate is given, and the condition
Publikováno v:
Journal of Surface Investigation. X-ray, Synchrotron and Neutron Techniques. 6:330-337
For a model of the collective motion of minority charge carriers (MCCs) generated by various external energy sources (broad electron and light beams) in a homogeneous semiconductor material, a method for approximating their statistical characteristic