Zobrazeno 1 - 10
of 35
pro vyhledávání: '"A. M. J. den Haan"'
Autor:
B. Bryant, Floris Kalff, A. M. J. den Haan, M.A. van Spronsen, J. M. de Voogd, A. F. Otte, Tjerk H. Oosterkamp, Irene M. N. Groot, O. Ostojic, M. J. Rost
Publikováno v:
Ultramicroscopy
Ultramicroscopy, 181, 61-69. Elsevier
Ultramicroscopy, 181, 61-69
Ultramicroscopy, 181
Ultramicroscopy, 181, pp. 61-69
Ultramicroscopy, 181, 61-69. Elsevier
Ultramicroscopy, 181, 61-69
Ultramicroscopy, 181
Ultramicroscopy, 181, pp. 61-69
Within the last three decades Scanning Probe Microscopy has been developed to a powerful tool for measuring surfaces and their properties on an atomic scale such that users can be found nowadays not only in academia but also in industry. This develop
Autor:
L. Bossoni, R. J. Donkersloot, M. de Wit, Tjerk H. Oosterkamp, F. Marsman, J. J. T. Wagenaar, A. M. J. den Haan
Publikováno v:
Physical Review Applied, 7(2), 024019
Physical Review Applied
Physical Review Applied
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::c6c75d9be37c2ce8edf2eec5252b4a10
https://arxiv.org/abs/1609.05685
https://arxiv.org/abs/1609.05685
Autor:
M. de Wit, A. M. J. den Haan, Teun M. Klapwijk, Tjerk H. Oosterkamp, Akira Endo, Koen M. Bastiaans, L. Bossoni, T. A. de Jong, Jan Zaanen, J. J. T. Wagenaar, J. M. de Voogd, David J. Thoen
Publikováno v:
Physical Review Applied, 6(1)
Physical Review Applied
Physical Review Applied
Nuclear spin-lattice relaxation times are measured on copper using magnetic resonance force microscopy performed at temperatures down to 42 mK. The low temperature is verified by comparison with the Korringa relation. Measuring spin-lattice relaxatio
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::ed8b891d301b28318b3dc8cde1efb9df
http://resolver.tudelft.nl/uuid:19954de3-fa21-4096-8616-1bebb81fcc48
http://resolver.tudelft.nl/uuid:19954de3-fa21-4096-8616-1bebb81fcc48
Autor:
H. J. Eerkens, A. M. J. den Haan, A. L. La Rooij, Robert J. C. Spreeuw, L. Bossoni, Paul F. A. Alkemade, Tjerk H. Oosterkamp, Hiske Overweg
Publikováno v:
Applied Physics Letters, 107(7):072402. American Institute of Physics
Applied Physics Letters, 107 (7), 2015
Applied Physics Letters, 107, 072402
Applied Physics Letters, 107 (7), 2015
Applied Physics Letters, 107, 072402
We investigate the degradation of the magnetic moment of a 300 nm thick FePt film induced by Focused Ion Beam (FIB) milling. A $1~\mu \mathrm{m} \times 8~\mu \mathrm{m}$ rod is milled out of a film by a FIB process and is attached to a cantilever by
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::57139c490429b3a14d75837189dc0a69
https://dare.uva.nl/personal/pure/en/publications/probing-the-magnetic-moment-of-fept-micromagnets-prepared-by-focused-ion-beam-milling(6550a30f-764b-4059-8e51-06c608016b4f).html
https://dare.uva.nl/personal/pure/en/publications/probing-the-magnetic-moment-of-fept-micromagnets-prepared-by-focused-ion-beam-milling(6550a30f-764b-4059-8e51-06c608016b4f).html
Publikováno v:
Physical Review B : Condensed Matter, 92, 235441
Physical Review B : Condensed Matter
Physical Review B : Condensed Matter
We measure the dissipation and frequency shift of a magnetically coupled cantilever in the vicinity of a silicon chip, down to $25$ mK. The dissipation and frequency shift originates from the interaction with the unpaired electrons, associated with t
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::51726349f75d845550d58e6771c9ca0d
Autor:
Tjerk H. Oosterkamp, G. Wijts, D. J. van der Zalm, O. Usenko, G.J.C. van Baarle, F. Galli, A. M. J. den Haan
Publikováno v:
Review of Scientific Instruments, 85, 035112
Pulse tube refrigerators are becoming more common, because they are cost efficient and demand less handling than conventional (wet) refrigerators. However, a downside of a pulse tube system is the vibration level at the cold-head, which is in most de
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::249a26f26e0af87257840b64580cb268
https://arxiv.org/abs/1312.6011
https://arxiv.org/abs/1312.6011
Autor:
Luo, Rui, Wang, Qian, Lu, Yu, Xu, Feng, Guo, Zhe, Xue, Fei, You, Long, Liu, Jinquan, Luo, Pengshun
Publikováno v:
Journal of Applied Physics; 11/21/2023, Vol. 134 Issue 19, p1-6, 6p
Publikováno v:
Journal of Applied Physics; 1/28/2022, Vol. 131 Issue 4, p1-6, 6p
Autor:
Wang, Yan, Zhang, Hui-Lai, Wu, Jin-Lei, Song, Jie, Yang, Kun, Qin, Wei, Jing, Hui, Kuang, Le-Man
Publikováno v:
SCIENCE CHINA Physics, Mechanics & Astronomy; Nov2023, Vol. 66 Issue 11, p1-14, 14p
Autor:
Zhou, Haibiao, Auerbach, Nadav, Roy, Indranil, Bocarsly, Matan, Huber, Martin E., Barick, Barun, Pariari, Arnab, Hücker, Markus, Lim, Zhi Shiuh, Ariando, A., Berdyugin, Alexey I., Xin, Na, Rappaport, Michael, Myasoedov, Yuri, Zeldov, Eli
Publikováno v:
Review of Scientific Instruments; May2023, Vol. 94 Issue 5, p1-9, 9p