Zobrazeno 1 - 10
of 93
pro vyhledávání: '"A. M. Holburn"'
Publikováno v:
Electron Microscopy and Analysis 1997 ISBN: 9781003063056
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::0638ef1d93d4bcf191c7f05643c2ff41
https://doi.org/10.1201/9781003063056-12
https://doi.org/10.1201/9781003063056-12
Publikováno v:
Microscopy and Microanalysis. 27:2756-2757
Publikováno v:
Microscopy and Microanalysis. 26:2124-2125
Autor:
David M. Holburn, Joon Huang Chuah
Publikováno v:
IEEE Sensors Journal. 15:5997-6004
This paper presents a transimpedance amplifier (TIA) which was optimized for detecting very weak signals generated for microscopy imaging in the scanning electron microscope (SEM). This high-performance TIA was designed using a nomograph approach. Th
Autor:
Joon Huang Chuah, David M. Holburn
Publikováno v:
International Journal of Electronics. 102:157-171
This paper presents a selector–combiner (SC) circuit for use as a constituent block for a multi-pixel complementary metal-oxide-semiconductor (CMOS) photon detector. The circuit essentially allows signal from pixels of interest to be summed and out
Autor:
David M. Holburn, Joon Huang Chuah
Publikováno v:
International Journal of Electronics. 101:1662-1670
This paper presents a fully integrated digitally controlled CMOS voltage amplifier. Operating at 3.3 V, this three-stage amplifier was designed and fabricated in an Austriamicrosystems (AMS) 0.35 µm process technology. The amplifier does not require
Publikováno v:
Microscopy and Microanalysis. 24:516-517
Publikováno v:
Microscopy and Microanalysis. 24:496-497
Autor:
Joon Huang Chuah, David M. Holburn
Publikováno v:
Analog Integrated Circuits and Signal Processing. 79:395-411
In this paper, a novel integrated solid-state solution is proposed to replace the vacuum-based photomultiplier tube and other constituent components of the Everhart–Thornley detector, which has been widely used for secondary electron detection in s
Autor:
Joon Huang Chuah, David M. Holburn
Publikováno v:
Microelectronics International. 30:115-124
PurposeThe purpose of this paper is to design a very low‐noise transimpedance amplifier (TIA) for a novel multi‐pixel CMOS photon detector which performs secondary electron (SE) detection in the scanning electron microscope (SEM).Design/methodolo