Zobrazeno 1 - 10 of 10 pro vyhledávání: '"A. L. Karpei"'
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Autor: A. L. Karpei, A. I. Akimov, G. K. Savchuk
Publikováno v: Journal of Applied Spectroscopy. 67:976-980
We have investigated the IR reflection spectra of ferroelectric ceramics based on solid solutions of lead zirconate-titanate with a rhombohedral structure obtained by high-pressure cold precompaction. In the 55–65-cm−1 frequency range, we have re
Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_________::95e1cfa488d9ecfb3568b2d09cdbdbce
https://doi.org/10.1023/a:1004168320640
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2
Unusual induction of optical anisotropy in polymer media by low-intensity polarized x-rays
Autor: N. Nizamov, A. L. Karpei, A. S. Prishchenov
Publikováno v: Journal of Applied Spectroscopy. 64:650-653
The induction of linear dichroism in (poly) methylmetacrylate films activated with Rhodamine 6G and its base in the spectral range of absorption of these dyes under the action of plane-polarized x-rays with wavelength 0.70A and intensity 7.5·104 qua
Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_________::066e8994ac556450abecde756a2f1fd0
https://doi.org/10.1007/bf02675327
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4
Dynamical Oscillations of X-Ray Integrated Intensity in Laue Diffraction and Their Temperature Dependences for Si Dislocation Crystals
Autor: V. M. Skidan, N. M. Olekhnovich, L. D. Puzenkova, A. L. Karpei
Publikováno v: physica status solidi (a). 72:463-467
Results of a study of thickness oscillations (Pendellosung beats) of the X-ray integrated intensity for the symmetrical Laue case of silicon dislocation single crystals are presented over the temperature range from 100 to 295 K. The oscillation perio
Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_________::d776ea43989f0797faa6c375db51b4c2
https://doi.org/10.1002/pssa.2210720204
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5
Polarization of Mo Kα -radiation of the bragg diffraction in real silicon crystals
Autor: N. M. Olekhnovich, A. L. Karpei, V. L. Markovich
Publikováno v: Kristall und Technik. 13:1463-1469
The results are given for the experimental investigation of the polarization ratio (ϱ∥/ϱ⊥) and the integrated intensity (ϱ⊥) for the Bragg reflections 111, 333, 444 of silicon crystals with different dislocations density (Nd). The measured p
Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_________::63ee68bc16a7b3fc0d8c32533475a7e5
https://doi.org/10.1002/crat.19780131215
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7
Dynamical effects of X-ray scattering in laue geometry for Si crystals with structure defects
Autor: A. L. Karpei, N. M. Olekhnovich
Publikováno v: Physica Status Solidi (a). 82:365-371
Results of an investigation of thickness oscillations of the X-ray integrated intensity and anomalous transmission of plane-polarized MoKα radiation in the Laue geometry for dislocation-free silicon crystals containing oxygen are reported. The stati
Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_________::d42eb7c581d5561ac8904a65d039eabc
https://doi.org/10.1002/pssa.2210820204
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