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Investigation of Sisal Fibers by Atomic Force Microscopy: Morphological and Adhesive Characteristics
Autor:
Fabio L. Leite, A.A.S. Curvelo, Paulo S. P. Herrmann, Fabio Cop Ferreira, A. L. Da Roz, Luiz H. C. Mattoso
Publikováno v:
Journal of Nanoscience and Nanotechnology. 6:2354-2361
Atomic force microscopy (AFM) was used to study the nanoscale surface chemistry and morphological changes caused by chemical treatment of sisal fibers. Scanning Electron Microscopy (SEM) micrographs indicated that sisal in natura (bundle of fibers) i
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::3e8dfe7849fa054b9828ff4ee3e128eb
https://doi.org/10.1166/jnn.2006.522
https://doi.org/10.1166/jnn.2006.522
